Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Tae-Young Won"'
Publikováno v:
Journal of the Korean Physical Society. 64:1483-1487
In this paper, we report a theoretical study on the electrical-optical properties of phosphorescent organic light-emitting diodes (PHOLEDs). Our simulation reveals that the refractive index of each material plays a crucial role in the emission charac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42c39288581993d692f63855b45edb15
https://doi.org/10.3938/jkps.64.1483
https://doi.org/10.3938/jkps.64.1483
Publikováno v:
Advanced Materials Research. 629:44-48
In this paper, we report our numerical study on the electrical-optical properties of the organic light emitting diodes (OLEDs) devices with n-doped layer, which is inserted in an effort to reduce the interface barrier between the cathode and the ETL(
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f86eef9f30765e3204b5a3ec6903e146
https://doi.org/10.4028/www.scientific.net/amr.629.44
https://doi.org/10.4028/www.scientific.net/amr.629.44
Publikováno v:
Advanced Materials Research. 629:224-228
We report our finite element method (FEM) simulation study on the characteristic of the charge transport layer of the multi-layer structure for organic light emitting diodes (OLEDs). The physical model cover all the key physical processes in OLEDs, n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9aaa4054e03d5e354d9a0515986a4b1
https://doi.org/10.4028/www.scientific.net/amr.629.224
https://doi.org/10.4028/www.scientific.net/amr.629.224
Publikováno v:
Tribology Transactions. 54:87-95
In an automobile chassis system, several environmental factors reduce the durability of automotive components. In particular, dust particles entering through rubber seals increase the friction and wear of sliding surfaces. Increased wear causes noise
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b7cca1dbecc58ecb88712d5e66849cc3
https://doi.org/10.1080/10402004.2010.524346
https://doi.org/10.1080/10402004.2010.524346
Autor:
Tae Young Won, Kwan Sun Yoon
Publikováno v:
Solid State Phenomena. :1681-1684
In this paper, we present ab-initio study on the energy configurations, minimum energy path (MEP), and migration energy of neutral indium atom during diffusion in silicon crystal. From the ab-initio calculation of electronic structure, we could figur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::103af5ebfb041ff63e1d6cec95127ad5
https://doi.org/10.4028/www.scientific.net/ssp.124-126.1681
https://doi.org/10.4028/www.scientific.net/ssp.124-126.1681
Publikováno v:
Journal of nanoscience and nanotechnology. 15(2)
UNLABELLED In this paper, we report our numerical study on the electronic-optical properties of the organic light emitting diodes (OLEDs) devices. In order to calculate the electrical and optical characteristics such as the transport behavior of carr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::74d3c167f0b40c6f4402b31b2d07dc32
https://pubmed.ncbi.nlm.nih.gov/26353658
https://pubmed.ncbi.nlm.nih.gov/26353658
Autor:
Tae Young Won, Young Wook Hwang
Publikováno v:
Journal of nanoscience and nanotechnology. 14(8)
In this paper, we report our numerical study on the electrical and optical properties in HTL/mCP/ETL multilayer organic light emitting diode (OLED) device structure. Our finite element method (FEM) model includes the transport behavior of electrons a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37287acb5c11854e7a34b26ab084772e
https://pubmed.ncbi.nlm.nih.gov/25936004
https://pubmed.ncbi.nlm.nih.gov/25936004
Publikováno v:
Microelectronic Engineering. 15:253-256
We propose a new self-aligned ITLDD process with minimum gate-drain overlap capacitance by employing a double stepped gate oxide under the overlapped gate and present our device and circuit simulation results to confirm the merits of the proposed gat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14cce7a755dd4656f09d3fa2d36e6975
https://doi.org/10.1016/0167-9317(91)90223-z
https://doi.org/10.1016/0167-9317(91)90223-z
Publikováno v:
ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361).
This paper reports Monte Carlo calculation of the bimolecular reaction of extended defects which successfully predicts both the as-implanted impurity profiles (SIMS) and the diffusion profiles for a wide range of implant and annealing conditions. We
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7f888b74a65b1e2aab78d70c9d31879
https://doi.org/10.1109/icvc.1999.820951
https://doi.org/10.1109/icvc.1999.820951