Zobrazeno 1 - 10
of 64
pro vyhledávání: '"Tae Soo Park"'
Publikováno v:
Journal of Orthopaedic Surgery, Vol 27 (2019)
Background: The association between tuberosity cysts and rotator cuff tears (RCTs) and the nature of the major contributing factors to tuberosity cyst formation continue to be controversial. The purpose of our study was to evaluate the strength of as
Externí odkaz:
https://doaj.org/article/afbb3e57748c4a148826b82b5de23d13
Autor:
Hyung Bin Park, Tae Soo Park
Publikováno v:
Indian Journal of Orthopaedics
Indian Journal of Orthopaedics, Vol 53, Iss 1, Pp 111-116 (2019)
Indian Journal of Orthopaedics, Vol 53, Iss 1, Pp 111-116 (2019)
Background: In spite of frequent injuries to the acromioclavicular (AC) joint, there is no consensus regarding optimal technique to be used. This cohort study evaluated the clinical results of a modified Weaver-Dunn procedure with or without chip bon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7fa35f506d9f590b1cb2dde385bd2b49
https://pubmed.ncbi.nlm.nih.gov/30905990
https://pubmed.ncbi.nlm.nih.gov/30905990
Autor:
Tae Soo Park, Ok-Ran Jeong
Publikováno v:
Journal of Internet Computing and Services. 17:153-158
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07cf0eefbe49b7c60b874d6d1093a714
https://doi.org/10.7472/jksii.2016.17.6.153
https://doi.org/10.7472/jksii.2016.17.6.153
Autor:
Kwang‑Won Lee, Tae Soo Park
Publikováno v:
Indian Journal of Orthopaedics, Vol 50, Iss 4, Pp 379-383 (2016)
Indian Journal of Orthopaedics
Indian Journal of Orthopaedics
Background: Symptomatic acromioclavicular joint (ACJ) lesions are a common cause of shoulder complaints that can be treated successfully with both conservative and surgical methods. There are several operative techniques, including both open and arth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f67ef22ab1cf3d57ebea3da92abae6e7
http://www.ijoonline.com/article.asp?issn=0019-5413
http://www.ijoonline.com/article.asp?issn=0019-5413
Autor:
Seung Ho Lee, Tae-Soo Park
Publikováno v:
Journal of the Korean Geotechnical Society. 31:29-36
This paper deals with inspecting and monitoring cracks developed on a subway tunnel liner during the construction of temporary supports and excavation. The cracks have developed near a enlarged part of the tunnel. Several measurements, crack gauge, i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ebf90db371ce7d3704508b5ff7ae687
https://doi.org/10.7843/kgs.2015.31.10.29
https://doi.org/10.7843/kgs.2015.31.10.29
Publikováno v:
Journal of the Korean Society of Manufacturing Process Engineers. 14:42-49
In this study, the multi-disk of a high-pressure drop control valve is designed and manufactured. Then, the flow rate and high-pressure drop of fluids flowing in the high-pressure drop control valve is CAE/CFD. This study involves numerical analysis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc207477e2c82005327fa57c4dc82420
https://doi.org/10.14775/ksmpe.2015.14.5.042
https://doi.org/10.14775/ksmpe.2015.14.5.042
Publikováno v:
Arthroscopy and Orthopedic Sports Medicine. 2:71-76
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68a104b868ffdcb3f7b0bdb2473f738b
https://doi.org/10.14517/aosm14008
https://doi.org/10.14517/aosm14008
Autor:
Ju-Heon Kim, Hyunmi Sim, Dongkeun Na, Tae-Soo Park, Euna Ok, Yong-Beom Cho, Dae Hyun kim, Ho Seok Song, Seok-jun Won
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper, impact of carbon on threshold voltage in MOSFET-based device is studied by 3D-atom probe tomography (APT). Carbon is one of most difficult contaminants incorporated from fab-environment to be detected by typical analytical techniques s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cee370582d1ddb07d49d0156b4da03d4
https://doi.org/10.31399/asm.cp.istfa2017p0123
https://doi.org/10.31399/asm.cp.istfa2017p0123
Autor:
Hyeyoung Hong, Seonghyun Yang, Tae-Soo Park, Suhaeng Heo, Yong-Woon Han, Yong-Beom Cho, Hun-Seong Choi, Seok-jun Won
Publikováno v:
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Defect localization of short failures has been a big challenge in modern advanced nanoscale devices. In recent years, Electron Beam Induced Resistance Change (EBIRCh) technique has been applied to failure analysis. The EBIRCh technique incorporated i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80e69f66b2b83ffa57f11f7493500f8a
https://doi.org/10.1109/ipfa.2017.8060090
https://doi.org/10.1109/ipfa.2017.8060090
Publikováno v:
Arthroscopy and Orthopedic Sports Medicine. 1:40-45
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7bef90fede3b89c55ad455126ef8b7c6
https://doi.org/10.14517/aosm13017
https://doi.org/10.14517/aosm13017