Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Tae Kyung Oh"'
Autor:
Hyunwoo Yang, Nak-hoon Son, Dongwook Kim, Jae-Hee Chun, Jin Sung Kim, Tae Kyung Oh, Minwook Lee, Hyung Jun Kim
Publikováno v:
BMC Oral Health, Vol 24, Iss 1, Pp 1-11 (2024)
Abstract Background Iatrogenic mandibular nerve damage resulting from oral surgeries and dental procedures is painful and a formidable challenge for patients and oral surgeons alike, mainly because the absence of objective and quantitative methods fo
Externí odkaz:
https://doaj.org/article/fc9b3351b9504a4ab9343d9b1e388263
Autor:
Hyunwoo Yang, Nak-hoon Son, Dongwook Kim, Jae-Hee Chun, Jin Sung Kim, Tae Kyung Oh, Minwook Lee, Hyung Jun Kim
Publikováno v:
BMC Oral Health, Vol 24, Iss 1, Pp 1-1 (2024)
Externí odkaz:
https://doaj.org/article/65d16ec960ea45da915280412b382a36
Publikováno v:
Journal of Turbomachinery. 143
The study focuses on evaluating fully coupled conjugate heat transfer (CHT) simulation in a ribbed cooling passage with a fully developed flow assumption using large eddy simulation (LES) with the immersed boundary method (IBM-LES-CHT). The IBM-LES a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de964aa8bc38da58187e3cd5bf44377a
https://doi.org/10.1115/1.4050111
https://doi.org/10.1115/1.4050111
Publikováno v:
Volume 5A: Heat Transfer.
The present study focuses on evaluating fully-coupled conjugate heat transfer simulation in a ribbed cooling passage with a fully developed flow assumption using LES with the immersed boundary method (IBM-LES-CHT). The IBM-LES and the IBM-CHT framewo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::535cefd69917b85a9a2f416ddda7ca00
https://doi.org/10.1115/gt2019-90397
https://doi.org/10.1115/gt2019-90397
Autor:
Jung Ho Shin, Min-Soo Yoo, Sung-Joo Hong, Yong-Taik Kim, Tae-Kyung Oh, Tae-Su Jang, Kyung Kyu Min, Donghoon Nam, Heimi Kwon, Seong-Wan Ryu
Publikováno v:
2017 IEEE International Electron Devices Meeting (IEDM).
We demonstrated a highly reliable buried-gate saddle-fin cell-transistor (cell-TR) using silicon migration technique of hydrogen (H 2 ) annealing after a dry etch to form the saddle-fin in a fully integrated 2y-nm 4Gb DRAM. It clearly shows a reducti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ecc4366a8e576cbe5bcf1385d2c933d
https://doi.org/10.1109/iedm.2017.8268437
https://doi.org/10.1109/iedm.2017.8268437
Autor:
Jung Eun Lee, Woo Taek Kim, Li Hua Cui, Yoonjee Kang, Tae Kyung Oh, Hyoungseok Lee, Mi Young Byun, Hyun Woo Park
Publikováno v:
Plant Science. 236:61-74
Deschampsia antarctica is an Antarctic hairgrass that grows on the west coast of the Antarctic peninsula. In this report, we have identified and characterized a transcription factor, D. antarctica C-repeat binding factor 7 (DaCBF7), that is a member
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::179ed0fcadd3bd16cb6987595c1bd042
https://doi.org/10.1016/j.plantsci.2015.03.020
https://doi.org/10.1016/j.plantsci.2015.03.020
Autor:
Woo Taek Kim, Ki Youl Park, Tae Kyung Oh, Bin Goo Kang, Li Hua Cui, Ye Jin Jung, Mi Young Byun, Andosung Lee
Publikováno v:
Frontiers in Plant Science
Rice U-box E3 Ub ligases (OsPUBs) are implicated in biotic stress responses. However, their cellular roles in response to abiotic stress are poorly understood. In this study, we performed functional analyses of two homologous OsPUB2 and OsPUB3 in res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4065bd4d4b4c80e83c4cd68d764ff707
http://europepmc.org/articles/PMC5247461
http://europepmc.org/articles/PMC5247461
Autor:
S. J. Hong, Cheolgyu Kim, Seonhaeng Lee, Dongwoo Kim, Seon-Yong Cha, Bongkoo Kang, Tae-Kyung Oh
Publikováno v:
Microelectronic Engineering. 91:44-49
Methods of measuring mechanical stresses which are induced by hybrid shallow-trench-isolation (STI) for dynamic random access memories (DRAMs) using recess channel array transistor (RCAT) structure, are investigated. The STI was fabricated using high
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a875754ffef58fc55aa502a8d75716a1
https://doi.org/10.1016/j.mee.2011.10.015
https://doi.org/10.1016/j.mee.2011.10.015
Publikováno v:
Microelectronic Engineering. 88:882-887
This paper proposes an electrical method of extracting mechanical stress in n-MOSFETs and analyzes the influence of dummy active patterns on mechanical stress induced by spin-on-glass-filled shallow trench isolation (SOG-filled STI). The proposed met
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe995ea653ce42575cf50e6a3440af1a
https://doi.org/10.1016/j.mee.2010.11.036
https://doi.org/10.1016/j.mee.2010.11.036
Autor:
Jae Goan Jeong, Yun Taek Hwang, Min Soo Yoo, Jaehoon Choi, Yunseok Chun, Sungwook Park, Hyoung-Gyu Choi, Sung Kye Park, Tae Kyung Oh, Shin Gyu Choi, Sung Joo Hong, Yun Ik Son, Kang Sik Choi, Jong Ii Kim, Woo Kyung Sun
Publikováno v:
Journal of the Korean Physical Society. 56:643-647
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2dd07dac91e7b0fe8b04a3b34acc3e28
https://doi.org/10.3938/jkps.56.643
https://doi.org/10.3938/jkps.56.643