Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Tadanobu TOBA"'
Publikováno v:
IEEE Open Journal of Intelligent Transportation Systems, Vol 5, Pp 483-494 (2024)
The last few decades have witnessed a dramatic evolution of Artificial Intelligence (AI) algorithms, represented by Deep Neural Networks (DNNs), resulting in AI-enabled systems being significantly dominant in various fields, including robotics, healt
Externí odkaz:
https://doaj.org/article/94c713fb0e214a79bc92518f38196f3c
Publikováno v:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :523-531
Publikováno v:
IEEE Transactions on Nuclear Science. 68:1668-1674
As GPU applications expand, the reliability of GPU is drawing more attention since even reliability-demanding applications are executed on GPUs. Silent data corruption (SDC) is widely studied both in irradiation experiments and fault injection experi
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28:726-735
In this article, we propose a method for designing online totally self-checking (TSC) comparators for TSC systems implementable on field-programmable gate arrays (FPGAs). This method can be used to conduct exhaustive online diagnostics of each lookup
Publikováno v:
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Publikováno v:
ITC
The reliability of GPUs is becoming a major concern due to the increased probability of failures and the high vulnerability of GPUs compared to conventional CPUs in terms of tasks per failure. While there are extensive countermeasures against failure
Publikováno v:
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Publikováno v:
IEICE Transactions on Electronics. :382-390
Publikováno v:
2017 IEEE 2nd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC).
This paper presents a Configuration RAM (CRAM) diagnosis macro achieving high-speed detection and correction of neutron-induced soft errors in static random access memory (SRAM)-type field-programmable gate arrays (FPGAs), and the design methodology
Publikováno v:
ATS
Technology scaling of semiconductor devices improves circuit performance but at the same time degrades a radiation-induced soft-error tolerance. The measurement of soft-error tolerance of devices is one of key technologies to guarantee quality reliab