Zobrazeno 1 - 7
of 7
pro vyhledávání: '"TRAN DUC, CHINH"'
Autor:
Tran Duc Chinh
Publikováno v:
Опір матеріалів і теорія споруд, Iss 96, Pp 66-73 (2015)
Based on the integral representation of the displacements functions through Green's functions, the author proposed a method to solve the system of differential equations of the given problem. The equations were solved approximately by reducing to alg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doajarticles::213bc73b50802d240fb1e95660b9e330
http://opir.knuba.edu.ua/files/zbirnyk-96/05-96_tin_angl_.pdf
http://opir.knuba.edu.ua/files/zbirnyk-96/05-96_tin_angl_.pdf
Autor:
Dang Xuan Truong, Tran Duc Chinh
Publikováno v:
Опір матеріалів і теорія споруд, Iss 93, Pp 73-83 (2014)
The report presents a methodology to determine the directions of the stiffness principal axis (in this case subject to the linear displacement and forced rotation angle) of a solid object interact with the surrounding environment by resilient bearing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doajarticles::2436da69e4ac8a908901eeb5fd981f0c
http://opir.knuba.edu.ua/files/zbirnyk-93/12.pdf
http://opir.knuba.edu.ua/files/zbirnyk-93/12.pdf
Autor:
Tran Duc Chinh
Publikováno v:
International Journal of Mechanical Sciences. 42:1971-1982
In this paper the author, has presented a solution to the problem of dynamics of shallow shell taking into account physical non-linearities. The shell is made of non-linear material obeying a cubic stress–strain law, and energy dissipation has been
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::220e533d5470f1b59d6cde1288e57973
https://doi.org/10.1016/s0020-7403(99)00069-7
https://doi.org/10.1016/s0020-7403(99)00069-7
Publikováno v:
Journal of Applied Physics. 90:2612-2614
During a comparative study of second-harmonic generation (SHG) and sum-frequency generation (SFG) in single-crystal and polycrystalline ZnSe, the polycrystalline material showed a dot pattern in the SHG as well as in the SFG output. No such pattern w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60d2691c9c1d5b20eafc54fabeea481b
https://doi.org/10.1063/1.1388576
https://doi.org/10.1063/1.1388576
Autor:
Vladimir Dr. Korobochko, Bjoern Mader, Kai Gaebel, Juergen Kleinschmidt, Henry Birner, Guido Hergenhan, Jesko Dr. Brudermann, Sven Goetze, Denis Bolshukhin, Uwe Stamm, Imtiaz Ahmad, Diethard Kloepfel, Guido Schriever, Frank Flohrer, Rainer Mueller, Tran Duc Chinh, Christian Ziener, Jens Ringling
Publikováno v:
High-Power Laser Ablation V.
The availability of extreme ultraviolet (EUV) light sources, measurement tools and integrated test systems is of major importance for the development of EUV lithography for use in high volume chip manufacturing which is expected to start in 2009. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::097b00202bce4b9e309d1da2e1a34eff
https://doi.org/10.1117/12.548385
https://doi.org/10.1117/12.548385
Autor:
Juergen Kleinschmidt, Tran Duc Chinh, Guido Hergenhan, Guido Schriever, Vladimir Korobotchko, Sven Goetze, Henry Birner, Imtiaz Ahmad, Rainer Mueller, Jens Ringling, Christian Ziener, Frank Flohrer, Uwe Stamm, Diethard Kloepfel, Björn Mader, Kai Gaebel, Denis Bolshukhin, Jesko Dr. Brudermann
Publikováno v:
SPIE Proceedings.
Semiconductor chip manufacturers are expecting to use extreme ultraviolet (EUV) lithography for high volume manufacturing of DRAMs and ICs starting by the end of this decade. Among all the technologies and modules which have to be developed EUV sourc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a620b775326f27a8daf5d146b1880766
https://doi.org/10.1117/12.535410
https://doi.org/10.1117/12.535410
Autor:
TRAN DUC, CHINH
Publikováno v:
International Journal for Numerical Methods in Engineering; 1997, Vol. 40 Issue 10, p1749-1765, 17p