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pro vyhledávání: '"TAY, B. K."'
Дефектно-примесная инженерия. Радиационные эффекты в полупроводниках The study of formation and diffusion of point defects in bulk and monolayer MoS2 is presented. First the formation of a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1594::398115e04782bab8bd669e3a967c0aec
http://elib.bsu.by/handle/123456789/215215
http://elib.bsu.by/handle/123456789/215215
Publikováno v:
Journal of Applied Physics; Jan2012, Vol. 111 Issue 1, p013515, 6p, 1 Diagram, 8 Graphs
Publikováno v:
Journal of Applied Physics; Oct2011, Vol. 110 Issue 8, p083502, 6p
Publikováno v:
Journal of Applied Physics; Feb2011, Vol. 109 Issue 4, p043508, 6p, 1 Diagram, 7 Graphs
Autor:
Han, Z. J.1 zjhan@ntu.edu.sg, Tay, B. K.1
Publikováno v:
European Physical Journal E -- Soft Matter. Mar2009, Vol. 28 Issue 3, p273-278. 6p. 3 Black and White Photographs, 2 Graphs.
Publikováno v:
Journal of Applied Physics; Mar2008, Vol. 103 Issue 6, p064307, 4p, 2 Diagrams, 2 Graphs
Autor:
Zhao, Z. W., Tay, B. K.
Publikováno v:
Journal of Applied Physics; 1/1/2007, Vol. 101 Issue 1, p013505-N.PAG, 5p, 2 Charts, 5 Graphs
Publikováno v:
Applied Physics A: Materials Science & Processing. Jul2005, Vol. 81 Issue 2, p405-411. 7p.
Publikováno v:
Journal of Applied Physics; 8/1/2004, Vol. 96 Issue 3, p1704-1708, 5p, 1 Chart, 6 Graphs
Publikováno v:
Journal of Applied Physics; 4/15/2004, Vol. 95 Issue 8, p4147-4150, 4p, 1 Diagram, 4 Graphs