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of 87
pro vyhledávání: '"T.N. Trick"'
Autor:
T.N. Trick
Publikováno v:
Proceedings of the IEEE. 87:1399-1403
Reactualisation de l'article ecrit en 1961, par W.L. Everitt, sur les perspectives d'evolution de la formation des ingenieurs, jusqu'en 2012, aux Etats Unis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ceb4ea422dc55f3d9b643fd02a9a2d2d
https://doi.org/10.1109/jproc.1999.775424
https://doi.org/10.1109/jproc.1999.775424
Autor:
T.N. Trick
Publikováno v:
IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications. 44:1041-1044
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f5f22d51fbcd2c10cb228524ac2ef5dd
https://doi.org/10.1109/tcsi.1997.641766
https://doi.org/10.1109/tcsi.1997.641766
Publikováno v:
1988., IEEE International Symposium on Circuits and Systems.
Two charge-based circuit simulation models are presented for the HEMT. One is somewhat empirically based and is termed the semiempirical model whereas the other is based on the device physics and is called the semiphysical model. Both models have bee
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00ab95ca5bb516a96e1d6c0638b715f7
https://doi.org/10.1109/iscas.1988.14950
https://doi.org/10.1109/iscas.1988.14950
Publikováno v:
Technology-Based Re-Engineering Engineering Education Proceedings of Frontiers in Education FIE'96 26th Annual Conference.
Mallard/sup TM/ is a World Wide Web based interactive learning environment suitable for use in a wide variety of courses. Mallard/sup TM/ provides a secure environment within which one can organize online course material and test students via interac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cca9a0321faafb3618a68bef252edb50
https://doi.org/10.1109/fie.1996.567679
https://doi.org/10.1109/fie.1996.567679
Autor:
T.N. Trick
Publikováno v:
Proceedings of 1994 IEEE Frontiers in Education Conference - FIE '94.
In this panel session Dr. James F. Gibbons, Dean of Engineering at Stanford University, Dr. John Carruthers, Intel Corporation, and Dr. Al Moye, Hewlett-Packard Corporation, give their views on the changing market for PhD graduates. As session chairm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c77344422c246d572036faa9bccaea1c
https://doi.org/10.1109/fie.1994.580625
https://doi.org/10.1109/fie.1994.580625
Akademický článek
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Akademický článek
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Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2:180-192
The efficiency of several variance reduction techniques (in particular, importance sampling, stratified sampling, and control variates) are studied with respect to their application in estimating circuit yields. This study suggests that one essential
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04e57447f8652bf558db4126d9dcaf7a
https://doi.org/10.1109/tcad.1983.1270035
https://doi.org/10.1109/tcad.1983.1270035
Autor:
F.B. Grosz, T.N. Trick
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 1:116-120
Several methods have become available recently for the determination of the steady-state response of nonlinear circuits. The Newton algorithm is one of the more successful methods. However, in certain cases, the method fails to converge to a steady-s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a19901ea76555088810b00ef3818c283
https://doi.org/10.1109/tcad.1982.1270002
https://doi.org/10.1109/tcad.1982.1270002
Autor:
V.B. Rao, T.N. Trick
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 6:128-144
This paper describes the algorithms used in a presimulation phase to partition an MOS digital network into various special subnetworks (or blocks) and to order these subnetworks for processing in a switch-level timing simulator such as MOSTIM [1]. A
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62da8bda0105cd1496a00f9d50942465
https://doi.org/10.1109/tcad.1987.1270255
https://doi.org/10.1109/tcad.1987.1270255