Zobrazeno 1 - 10
of 87
pro vyhledávání: '"T.M. Shen"'
Publikováno v:
2016 IEEE International Reliability Physics Symposium (IRPS).
Trap generation under BTI/TDDB stress for extremely scaled NMOSFETs and PMOSFETs is investigated. Trap identification and localization using SILC Spectrum technique is demonstrated. It has been verified that BTI/TDDB stress leads to trap generation p
Autor:
T.F. Chen, D. Gitlin, W.M. Wang, L.Y. Tung, H.L. Meng, C.T. Tsai, S.C. Chiang, B.C. Lan, T.M. Shen, C.H. Tsai, Y.C. Liu, J.W. Pan, D. Nayak, C.J. Lee, W.T. Chang, Y.A. Chen, P.W. Liu, Yuhao Luo, C.H. Tung, L.W. Cheng, H.L. Shih, T.Y. Chang, M.F. Lu
Publikováno v:
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
For the first time, 75% and 7% drive current improvement is simultaneously achieved in both N/PMOS by adopting ultimate spacer process (USP) with a single stress liner. High out-of-plane stress in the channel accounts for the simultaneously enhanced
Autor:
Y.S. Hsieh, G. Braithwaite, J.H. Ho, J.K. Chen, C.C. Huang, Ming-Ren Lin, N. Gerrish, Y.T. Loh, F. Singaporewala, Ariel Liu, W.T. Shiau, Y.Y. Chiang, J.R. Hwang, Richard Hammond, H.K. Lee, Mayank T. Bulsara, T.P. Chen, S.C. Chien, T.M. Shen, M. Currie, Qi Xiang, S.M. Ting, F. Wen, A. Lochtefeld
Publikováno v:
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
An 86% electron mobility improvement and over 20% I/sub dn-sat/ enhancement were demonstrated for a 70 nm strained-Si CMOS process fabricated on SiGe virtual substrates. Compared to a bulk-Si CMOS process, the strained-Si process delivered 95% higher
Publikováno v:
IEEE Photonics Technology Letters. 2:920-922
A multiple-quantum-well distributed-feedback (MQW-DFB) laser with narrow linewidth and low frequency chirp at low output power may experience linewidth rebroadening at high output power. the rebroadening is mostly due to a large carrier-induced chang
Conference
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Publikováno v:
Acta Horticulturae. :71-74
Publikováno v:
IEEE Photonics Technology Letters. 1:258-260
Reports that the etched-mesa buried-heterostructure distributed-feedback lasers ( lambda = 1.3 mu m) fabricated using semi-insulating InP blocking lasers have bandwidths in the 12-17 GHz range at 20 degrees C. 15 mW (18 GHz at 20 mW). The bandwidth d
Publikováno v:
Applied Physics Letters. 46:1036-1038
The fabrication and performance characteristics of InGaAsP (λ∼1.3 μm) double channel planar buried heterostructure lasers with multiquantum well (MQW) active layers are reported. The MQW structure has λg∼1.3 μm InGaAsP active wells and λg∼
Publikováno v:
Applied Physics Letters. 46:19-21
We report the fabrication and performance characteristics of InGaAsP double channel planar buried heterostructure (DCPBH) lasers with multiquantum well active layers emitting at 1.3 μm. These lasers have threshold currents in the range 40–50 mA at
Autor:
E. G. Burkhardt, Y. Twu, Niloy K. Dutta, T.M. Shen, John E. Bowers, S. G. Napholtz, Daniel Paul Wilt, Won-Tien Tsang, R. A. Logan, J. A. Ditzenberger
Publikováno v:
Journal of Applied Physics. 63:1218-1220
GaInAsP/InP double heterostructures grown by chemical‐beam epitaxy have been used in conjunction with liquid‐phase‐epitaxial regrowth to fabricate high‐performance buried heterostructure lasers operating at a wavelength of 1.5 μm. These lase