Zobrazeno 1 - 10
of 91
pro vyhledávání: '"T.K. Hatwar"'
Publikováno v:
Journal of Materials Research. 7:329-334
Thermal conductivity measurements were performed on several amorphous rare earth transition metal thin films of varying microstructure. The thermal conductivity perpendicular to the plane of the film, measured by the thermal comparator method, was co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f8c45a5e79b3238e5e2dc2d15c41b4c
https://doi.org/10.1557/jmr.1992.0329
https://doi.org/10.1557/jmr.1992.0329
Thermal conductivity of amorphous rare earth—transition metal thin films for magneto-optic recording
Publikováno v:
Thin Solid Films. 216:181-183
The thermal conductivity of a magneto-optic recording layer of sputtered amorphous TbFeCoZr is measured, and the results correlated with the thin film microstructure. Thermal conductivity K⊥ perpendicular to the plane of the film is measur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c1a21b06901448a78ba0c949b867aabe
https://doi.org/10.1016/0040-6090(92)90891-e
https://doi.org/10.1016/0040-6090(92)90891-e
Autor:
T.K. Hatwar
Publikováno v:
1997 IEEE International Magnetics Conference (INTERMAG'97).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67412fc3c48f7d39581e3bd581d09181
https://doi.org/10.1109/intmag.1997.597842
https://doi.org/10.1109/intmag.1997.597842
Publikováno v:
Joint International Symposium on Optical Memory and Optical Data Storage.
MO technology is now widely used for erasable optical storage. Almost all MO media products to date are based on rare-earth/transition metal alloys (RE-TM), such as TbFeCo. Although these alloys provide excellent recording performance, their intrinsi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0956703361ac845500a69deb7efa062e
https://doi.org/10.1364/isom.1996.owd.7
https://doi.org/10.1364/isom.1996.owd.7
Autor:
D.R. Chopra, T.K. Hatwar
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 35:77-85
Soft X-ray appearance-potential spectra (SXAPS) of La—Ni intermetallic compounds are presented. SXAPS probes the binding energy (BE) of the core levels and provides information about the local density of conduction band states of the constituents a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::39c0e4791858c0a369001b675f57b2d0
https://doi.org/10.1016/0368-2048(85)80043-8
https://doi.org/10.1016/0368-2048(85)80043-8
Autor:
D.R. Chopra, T.K. Hatwar
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 36:319-329
Appearance-potential Spectroscopy (APS) probes the binding energy of core levels and local conduction band states of atoms in the surface region. Soft X-ray APS (SXAPS) and Auger electron APS (AEAPS), respectively, measure the differential X-ray fluo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2418c9922b914b95f673b6c598b7c9b
https://doi.org/10.1016/0368-2048(85)80029-3
https://doi.org/10.1016/0368-2048(85)80029-3
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 33:141-152
Spectral characteristics representing the distribution of unoccupied conduction-band states in the 3 d transition-series metals Fe, Co, Ni and Cu, obtained using soft X-ray absorption (SXA), bremsstrahlung isochromat (BI) and characteristic isochroma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2deac171d8c29d2a05cffac102ab73c
https://doi.org/10.1016/0368-2048(84)80016-x
https://doi.org/10.1016/0368-2048(84)80016-x
Autor:
B.J Bartholomeusz, T.K. Hatwar
Publikováno v:
Thin Solid Films. 181:115-128
Ballistic aggregation models were utilized to explore and explain the possible origins of thickness, compositional and magnetic variations encountered in the sputter deposition of rare earth-transition metal thin films. They were also used to examine
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d54a37ebdb6c569d3e936f970c41bbde
https://doi.org/10.1016/0040-6090(89)90478-1
https://doi.org/10.1016/0040-6090(89)90478-1
Autor:
S.K. Ghosh, T.K. Hatwar
Publikováno v:
Thin Solid Films. 166:359-366
Stoichiometric silicon nitride and silicon oxynitride thin films were deposited at low temperature using r.f. diode reactive sputtering. The dependence of film properties on the sputtering parameters was studied. Depth profiling by X-ray photoelectro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19b42375672caee71d9c399a94c246e5
https://doi.org/10.1016/0040-6090(88)90398-7
https://doi.org/10.1016/0040-6090(88)90398-7
Autor:
T.K. Hatwar, D.R. Chopra
Publikováno v:
Applications of Surface Science. :267-274
Appearance potential spectroscopy (APS) probes the binding energy of core levels and local conduction band states of solid surfaces. Soft X-ray APS (SXAPS) and Auger electron APS (AEAPS) respectively measure the differential X-ray fluorescence and se
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::431b82158bc80990e92a0fe79298c6f6
https://doi.org/10.1016/0378-5963(85)90059-5
https://doi.org/10.1016/0378-5963(85)90059-5