Zobrazeno 1 - 10
of 102
pro vyhledávání: '"T.H. Sun"'
Publikováno v:
Plant, Soil and Environment, Vol 58, Iss 11, Pp 487-494 (2012)
In the present study, sunflower was used to enrich the cadmium (Cd) and lead (Pb) in sand culture, and the changes of metals uptake, organic acids, pH, and redox potential were investigated. Results showed that the Cd and Pb accumulation was dissimil
Externí odkaz:
https://doaj.org/article/25ab9c1a64624ab89fcca5b26c2f9aed
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
T.H. Sun, Hanjie Guo, J.R. Chen, Shien-Uang Jen, Ming-Han Liao, Sheng-Chi Chen, Wen-Sheng Yang
Publikováno v:
Journal of Alloys and Compounds. 803:341-347
Single-layered FePt films of 30 nm thickness with random orientation are produced by direct current magnetron sputtering (DCMS) deposited directly onto Corning 1737 glass substrates and then post-annealed at 700 °C for 30 min. In films produced by h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46f870ef66a17f17403b90bb7fbc8af9
https://doi.org/10.1016/j.jallcom.2019.06.216
https://doi.org/10.1016/j.jallcom.2019.06.216
Autor:
S.C. Chen, Jie-Yang Chiou, Chung-Hsien Wang, Shang-Tse Chen, T.H. Sun, Po-Cheng Kuo, J.R. Chen
Publikováno v:
IEEE Transactions on Magnetics. 50:1-4
Granular Co-rich Co-Pt nanograins having perpendicular coercivity (Hc ⊥ ) of 4.0 kOe and perpendicular squareness (S ⊥ ) of 0.75 can be achieved by depositing Co 80 Pt 20 (25 nm) film onto Ru (30 nm)/Ag (100 nm) bilayer films using an argon press
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43ce33062d1049b600d4299ffc33a898
https://doi.org/10.1109/tmag.2013.2297731
https://doi.org/10.1109/tmag.2013.2297731
Publikováno v:
Vacuum. 87:205-208
Fe100-xPtx films with Pt contents (x) = 29–65 at.% were deposited directly onto thermally oxidized Si(100) substrate by dc magnetron sputtering. The films were then post-annealed at 700 °C for 3 min by rapid thermal annealing (RTA) at a high heati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::874158fa26e62df179a5d8ab1d196a97
https://doi.org/10.1016/j.vacuum.2012.03.037
https://doi.org/10.1016/j.vacuum.2012.03.037
Publikováno v:
Thin Solid Films. 520:774-777
The single-layered Fe 100 − x Pt x films of 30 nm thick with Pt contents (x) of 35–57 at.% are deposited on heated Si (100) substrate at a temperature (Ts) of 620 °C by magnetron co-sputtering. When the Pt content in the Fe–Pt alloy film is 35
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6bf7b3ec34d35ab352cd7171a120adff
https://doi.org/10.1016/j.tsf.2011.04.164
https://doi.org/10.1016/j.tsf.2011.04.164
Publikováno v:
Thin Solid Films. 519:6964-6968
The FePt films with various thicknesses (t) of 5 to 50 nm are deposited on Si(100) substrate without any underlayer by in-situ annealing at substrate temperature (Ts) of 620 degrees C. A strong (001) texture of L1(0) FePt film is obtained and present
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc5efa658b54b3fe00ec03e06b032b20
https://doi.org/10.1016/j.tsf.2011.01.210
https://doi.org/10.1016/j.tsf.2011.01.210
Publikováno v:
IEEE Transactions on Magnetics. 47:524-527
The single-layered Fe5.4Pt4.6 films with thickness of 30 nm are deposited directly on Si substrate at substrate temperatures (Ts) of 370 to 620°C. The single-layered FePt films incline to random orientation as the Ts is lower than 570°C. Upon incre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca543b6265d7a4de8472fd15b14c87ca
https://doi.org/10.1109/tmag.2011.2107315
https://doi.org/10.1109/tmag.2011.2107315
Publikováno v:
IEEE Transactions on Magnetics. 47:517-520
The FePt(30 nm)/MgO bilayer films with various MgO(200) underlayer thicknesses of 0 to 30 nm are in-situ deposited on Si substrates. A weak (111)FePt peak as well as strong (001)FePt and (002)FePt peaks are observed in XRD pattern of single-layered F
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::343f8cfb3f9468664d01b5245185f282
https://doi.org/10.1109/tmag.2011.2104355
https://doi.org/10.1109/tmag.2011.2104355
Publikováno v:
Surface and Coatings Technology. 205:S236-S240
The NiO films were sputtered by radio frequency (rf) reactive magnetron sputtering with different O2 partial pressures. The electric resistivity (ρ) of NiO films continuously decreases from 0.45 to 0.01 Ω-cm as the O2 partial pressure is increased
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb73d4b22378a52572b742d3495ab077
https://doi.org/10.1016/j.surfcoat.2010.07.082
https://doi.org/10.1016/j.surfcoat.2010.07.082