Zobrazeno 1 - 10
of 68
pro vyhledávání: '"T. Warminski"'
Autor:
A.K. Duncan, T. Warminski
Publikováno v:
Materials Science Forum. :437-442
Autor:
C. J. Rossouw, Andrew W. Stevenson, Brian F. Usher, G. I. Christiansz, S. Georgiou, S. R. Glanvill, T. Warminski, Geoff N. Pain, Stephen W. Wilkins, M. S. Kwietniak, L. S. Wielunski
Publikováno v:
X-Ray Spectrometry. 19:79-83
Autor:
Patrick W. Leech, S.R. Glanvill, S. W. Wilkins, C. J. Rossouw, N. Petkovic, J. Thompson, Martyn H. Kibel, M. S. Kwietniak, P. J. Gwynn, Andrew W. Stevenson, T. J. Elms, Geoff N. Pain, D. Gao, T. Warminski, L. S. Wielunski, C. Sandford, N. Bharatula
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:1067-1077
Specular HgTe–CdTe superlattice epilayers have been obtained on two 2‐in. diam GaAs or sapphire wafers per growth run using a horizontal metalorganic chemical vapor deposition (MOCVD) reactor in which the pyrolysis of the organometallics is induc
Publikováno v:
2006 International Conference on Nanoscience and Nanotechnology.
The dilute nitride GaAsN has been grown by MBE using an ECR nitrogen plasma source. This has allowed growth at a substrate temperature of 600 C, which in combination with an ion trap, has produced higher quality as-grown material. Layer chemistry has
Autor:
T. Warminski, G. Stone
Publikováno v:
Technical Digest. CLEO/Pacific Rim'95. The Pacific Rim Conference on Lasers and Electro-Optics.
Publikováno v:
1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140).
The minimum V/III flux ratios for stoichiometric growth of In/sub 0.4/Ga/sub 0.6/As on GaAs have been measured from 250 to 500/spl deg/C. It is found that atomic hydrogen interacts strongly with surface As above a threshold temperature of about 300/s
Publikováno v:
1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140).
Most epitaxial layer growth involves mismatch between layer and growth substrate, even in the case of nearly lattice matched systems such as GaAs/AlAs. The accurate determination of layer thicknesses and stoichiometry in single and multi-layer hetero
Publikováno v:
2000 International Semiconducting and Insulating Materials Conference. SIMC-XI (Cat. No.00CH37046).
Interfacial coherence in low-strained In/sub x/Ga/sub 1-x/As grown on GaAs substrates has been studied and the critical strains corresponding to layer thicknesses of 0.5, 1.0, and 2.0 /spl mu/m have been determined. The measured critical strains exce
Publikováno v:
Fourth International Conference on Thin Film Physics and Applications.
In this work, we present a new approach to determining Poisson's ratio of AlAs. This approach requires the growth of a particular structure with a multiple quantum well (MQW) - 10X[500 angstroms GaAs/800 angstroms AlxGa1-xAs] followed by two single l
Publikováno v:
Journal of Applied Physics. 66:619-624
Ultramicrotome techniques are used to prepare thin cross sections of a {111} epilayer of CdTe deposited by metalorganic chemical vapor deposition onto a {100} GaAs substrate. The structure of these samples is investigated by transmission electron mic