Zobrazeno 1 - 5
of 5
pro vyhledávání: '"T. W. Steiner"'
Autor:
S. P. Tobin, J. P. Tower, P. W. Norton, D. Chandler-Horowitz, P. M. Amirtharaj, V. C. Lopes, W. M. Duncan, A. J. Syllaios, C. K. Ard, N. C. Giles, Jaesun Lee, R. Balasubramanian, A. B. Bollong, T. W. Steiner, M. L. W. Thewalt, D. K. Bowen, B. K. Tanner
Publikováno v:
Journal of Electronic Materials. 24:697-705
We report an overview and a comparison of nondestructive optical techniques for determining alloy composition x in Cd1-xZnxTe substrates for HgCdTe epitaxy. The methods for single-point measurements include a new x-ray diffraction technique for preci
Autor:
T W Steiner, M L W Thewalt
Publikováno v:
Semiconductor Science and Technology. 7:A16-A21
The authors have developed a whole wafer, cryogenic imaging system for making rapid absorption and photoluminescence maps of semiconductor wafers up to 100 mm in diameter. The cryostat requires no cryogens and can maintain a temperature of 15 K indef
Publikováno v:
Journal of the American Chemical Society. 110:5543-5547
La photoexcitation du naphtol-1 en presence de la N-nitrosodimethylamine induit la nitrosation du phenol en l'oxime-4 de la naphtoquinone-1,4. Le transfert de proton de l'etat excite est une etape indispensable de cette reaction photochimique
Publikováno v:
ChemInform. 19
Autor:
Thomas F. Kuech, Milan Jaros, T.W. Steiner, D. J. Wolford, J. A. Bradley, Domenico Ninno, M. A. Gell
We report on electronic and optical properties under pressure of GaAs Al x Ga 1− x As multi-quantum-wells and superlattices versus well-width and composition x. Photoluminescence measurements are used together with full-scale pseudopotential simula
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::61cafd803752bc63a458d1560cc1ea14
http://hdl.handle.net/11588/341558
http://hdl.handle.net/11588/341558