Výsledky vyhledávání - "T. V. Lytvynchuk"

Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons

Autor: E. G. Len, I. M. Fodchuk, V. B. Molodkin, T. P. Vladimirova, T. V. Lytvynchuk, E. V. Kochelab, Volodymyr Dovganyuk, B. V. Sheludchenko, E. N. Kislovskii, S. V. Lizunova, O. V. Reshetnyk, V. P. Kladko, S. I. Olikhovskii

Publikováno v: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 7:523-530

The quantitative diagnostics of complex defect structures in silicon crystals grown by the Czochralski method and irradiated with different doses of high-energy electrons (18 MeV) is performed by methods of high-resolution X-ray diffraction. The anal

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::594b22d0f76fbc8ab591fad92794088b
https://doi.org/10.1134/s1027451013030270

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X‐ray diffraction characterization of microdefects in silicon crystals after high‐energy electron irradiation

Autor: V. B. Molodkin, O. V. Reshetnyk, Z. Świątek, E. G. Len, S. I. Olikhovskii, Volodymyr Dovganyuk, V. P. Kladko, T. P. Vladimirova, T. V. Lytvynchuk, Ye. M. Kyslovskyy, I. M. Fodchuk, E. V. Kochelab, B. V. Sheludchenko, S. V. Lizunova

Publikováno v: physica status solidi (a). 208:2552-2557

The quantitative characterization of complex microdefect structures in silicon crystals grown by Czochralski method and irradiated with various doses of high-energy electrons (18 MeV) has been performed by methods of the high-resolution X-ray diffrac

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::796f96fc3bd08c40624042ae0d1da78a
https://doi.org/10.1002/pssa.201184253

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Defect structure changes in the single Si-crystals after irradiation by high-energy electrons and long natural aging by high-resolution three-crystal x-ray diffractometry

Autor: V. V. Dovganyuk, M. I. Fodchuk, T. V. Lytvynchuk, V. V. Slobodyan

Publikováno v: SPIE Proceedings.

Methods of two- and three-crystal X-ray high-resolution diffractometry were used to investigate structural changes in Cz-Si single crystals irradiated with high-energy electrons (E=18 MeV). The results of experimental investigation were interpreted b

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1665f31fd5682bebc71735e64482129f
https://doi.org/10.1117/12.797224

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