Zobrazeno 1 - 6
of 6
pro vyhledávání: '"T. V. Kritskaya"'
Publikováno v:
Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 24:5-26
Novel technical solutions and ideas for increasing the yield of solar and semiconductor grade polycrystalline silicon processes have been analyzed. The predominant polycrystalline silicon technology is currently still the Siemens process including th
Publikováno v:
Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 22:158-167
The process of growing silicon single crystals by the Czochralski method has been improved, which involves the use of two argon streams. 1st, the main flow, 15—20 nl/min, is directed from top to bottom along the growing single crystal. It captures
Publikováno v:
Russian Microelectronics. 43:546-551
The characteristics of low-power and power thyristors based on dislocation-free single crystals of germanium-doped silicon in the range of concentrations N Ge ∼ (0.05–1.5) × 1020 cm−3 are presented. Using the methods of processing of the exper
Autor:
N. S. Boltovets, A. V. Zorenko, V. V. Milenin, T. V. Korostinskaya, Andrian Kuchuk, T. V. Kritskaya, R. V. Konakova, V. P. Kladko, Alexander Belyaev, A. B. Ataubaeva, N. V. Kolesnik, L. M. Kapitanchuk, Ya. Ya. Kudryk, V.V. Basanets
Publikováno v:
Semiconductors. 45:253-259
The thermal limits of the two-drift impact avalanche and transit-time (IMPATT) diode operating in the pulsed mode in the 8-mm wavelength region with a microwave power as high as 30–35 W have been estimated. It is shown that p-n junction overheat at
Autor:
Konstantinos Zekentes, K. V. Vasilevskii, A.V. Zorenko, T. V. Kritskaya, N. S. Boltovets, A. V. Bludov, Valentyn A. Krivutsa, A. A. Lebedev
Publikováno v:
Technical Physics Letters. 30:123-125
Problems pertaining to the modeling and development of a microwave modulator based on 4H-SiC p-i-n diodes are considered. The results of theoretical and experimental investigations of the microwave characteristics of 4H-SiC p-i-n diodes and the param
Publikováno v:
Scopus-Elsevier
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