Zobrazeno 1 - 10
of 50
pro vyhledávání: '"T. Utaka"'
Autor:
Kazuo Taniguchi, Mikinori Nagano, Shuji Maeo, Shoichi Shimada, Ken-ichi Ueda, T. Utaka, Nobuyuki Zettsu, Kazuya Yamamura
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 616:281-284
A doubly curved crystal spectrometer with Johansson-type geometry is very effective for focusing and monochromatizing an X-ray beam. In this study, numerically controlled local wet etching (NC-LWE) was used to form the curvature of the Si(1 1 1) subs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f713a10a2f65b2b8726fc4b116226f3
https://doi.org/10.1016/j.nima.2009.12.006
https://doi.org/10.1016/j.nima.2009.12.006
Publikováno v:
X-Ray Spectrometry. 34:46-51
A portable x-ray fluorescence spectrometer equipped with a silicon drift detector (SDD) and a digital signal processor (DSP) was developed for in-field analysis of archeological samples at an excavation site. This spectrometer allows us to carry out
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::59c4ff4a91394831111d56cfebed1e57
https://doi.org/10.1002/xrs.752
https://doi.org/10.1002/xrs.752
Autor:
K. Ikeda, M. Uda, J. Kondo, T. Utaka, H. Oshio, A. Matsuo, S. Hasegawa, Y. Shirai, H. Sunaga, M. Saito, Y. Ban, D. Yamashita, S. Yoshimura, M. Tamada, Masaru Nakamura, Y. Nakajima, Y. Baba
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 189:382-386
“Amarna blue” pigments (18 Dynasty, c. 1400 BC) painted on pottery fragments were investigated using the PIXE, XRF and XRD methods in laboratories and also using a portable type of X-ray spectrometer at the sites of excavation. On the blue-colore
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad8a96a1d24cdaa7af451bd45b87cd35
https://doi.org/10.1016/s0168-583x(01)01094-1
https://doi.org/10.1016/s0168-583x(01)01094-1
Autor:
T. Utaka, K. Miyazaki, A. Shimazaki, M. Funabashi, T. Shoji, R. Wilson, Tomoya Arai, T. Fukuda
Publikováno v:
Advances in X-ray Analysis. 39:781-790
Over the past few years there has been substantial progress in the TXRF analysis of heavy element surface contamination on silicon wafers. Further advances and improvements are desired in the analytical performance and hardware. Extension of the anal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cdca00d0105a1bbcc260e26b2348022d
https://doi.org/10.1154/s0376030800023247
https://doi.org/10.1154/s0376030800023247
Publikováno v:
Advances in X-ray Analysis. 38:313-317
Total reflection X-ray fluorescence (TXRF) analysis of {open_quotes}low Z{close_quotes} elements, Ti, Fe, Ni, Cu, Zn and {open_quotes}high Z{close_quotes} elements, Zr, W, Au, Pb, are required for micro scale semiconductor device production processes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf9fd25f95bee3c1e2587948fe938fd2
https://doi.org/10.1154/s0376030800017948
https://doi.org/10.1154/s0376030800017948
Publikováno v:
Advances in X-ray Analysis. 37:599-605
Total reflection X-ray Fluorescence (TXRF) has been applied to the detection and quantification of metal contamination on the surface and near-surface regions of silicon wafers in the semiconductor industry The need for improving the sensitivity and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2cbd828378f49f626741ba6ca418bf39
https://doi.org/10.1154/s0376030800016153
https://doi.org/10.1154/s0376030800016153
Publikováno v:
Optical Fiber Communication Conference and Exhibit.
We reported the high performance channel waveguides fabricated through all-wet-photolithography technique by using UV curable siloxane based sol-gel materials. The refractive indices of the sol-gel materials introduced here could be easily controlled
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04d54cab26ec190501871543607f3abd
https://doi.org/10.1109/ofc.2002.1036643
https://doi.org/10.1109/ofc.2002.1036643
Publikováno v:
Advances in X-Ray Analysis ISBN: 9780306458033
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8676906a2fa17032831e80fc5ae17295
https://doi.org/10.1007/978-1-4615-5377-9_87
https://doi.org/10.1007/978-1-4615-5377-9_87
Publikováno v:
Advances in X-Ray Analysis ISBN: 9780306450457
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7e4e2e0216a190622b3b11729e8de3b2
https://doi.org/10.1007/978-1-4615-1797-9_36
https://doi.org/10.1007/978-1-4615-1797-9_36
Publikováno v:
Advances in X-Ray Analysis ISBN: 9781461360773
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b35502a73482da5ade42f711eaa511ba
https://doi.org/10.1007/978-1-4615-2528-8_72
https://doi.org/10.1007/978-1-4615-2528-8_72