Zobrazeno 1 - 10
of 47
pro vyhledávání: '"T. Torunski"'
Publikováno v:
Journal of Crystal Growth. 298:98-102
A novel method is presented which allows to expose and investigate interior interfaces in the Ga(NAsP)/GaP material system by a combination of highly selective etching and subsequent atomic force microscopy. We demonstrate the selectivity of the chem
Publikováno v:
Ultramicroscopy. 163
The introduction of preparation artifacts is almost inevitable when producing samples for (scanning) transmission electron microscopy ((S)TEM). These artifacts can be divided in extrinsic artifacts like damage processes and intrinsic artifacts caused
Autor:
T. Torunski, Kerstin Volz, C. Baur, Oleg Rubel, D. Lackner, Frank Dimroth, S. Müller, Wolfgang Stolz, Andreas W. Bett
Publikováno v:
Journal of Solar Energy Engineering. 129:266-271
The dilute nitride (GaIn)(NAs) material system grown lattice matched to GaAs or Ge with a 1eV band gap is an interesting material for the use in four-junction solar cells with increased efficiencies. As a result of its metastability, several challeng
Autor:
Bernardette Kunert, S. Nau, Kerstin Volz, S. Reinhard, Wolfgang Stolz, Oleg Rubel, T. Torunski
Publikováno v:
Journal of Crystal Growth. 272:739-747
We have grown (GaIn)(NAs) lattice-matched bulk as well as compressively strained multi-quantum-well structures by metal-organic vapour-phase epitaxy (MOVPE) suitable for either solar cell or laser applications, respectively. By applying a specific no
Publikováno v:
Journal of Crystal Growth. 261:330-335
We have investigated surface morphologies and cluster formation in Mn-incorporated (GaIn)As layers grown by metal-organic vapor phase epitaxy (MOVPE) on InP (1 0 0) substrates. Whisker growth occurs on the layer surfaces under low V/III ratios and lo
Autor:
Klaus Pierz, Wolfgang Stolz, Franz J. Ahlers, Ernst O. Göbel, T. Torunski, L. Gottwaldt, S. Nau
Publikováno v:
Journal of Applied Physics. 94:2464-2472
We have investigated the influence of interface roughness in GaAs/AlGaAs heterostructures on both the optical and the electronic properties by systematically varying the two growth parameters substrate temperature and growth interruption. We prove th
Autor:
T. Torunski, Ernst O. Göbel, Wolfgang Stolz, Franz J. Ahlers, S. Nau, Klaus Pierz, L. Gottwaldt
Publikováno v:
Journal of Crystal Growth. 251:85-89
We report the results of systematic studies of the influence of the growth temperature on the morphology of GaAs/(Al 0.3 Ga 0.7 )As quantum well interfaces. A combination of highly selective etching and subsequent atomic force microscopy measurements
Autor:
Wolfgang Stolz, W. Treutmann, Kerstin Volz, K. Megges, S. Nau, T. Torunski, Jörg Lorberth, M. Lampalzer
Publikováno v:
Journal of Crystal Growth. 248:474-478
We present the results of the epitaxial overgrowth of magnetic (MnGa)As-cluster structures with GaAs, (AlGa)As and AlAs using metal organic vapor phase epitaxy (MOVPE). The structural differences in the overgrowth are investigated by means of atomic
Publikováno v:
Applied Physics Letters. 85:5908-5910
By calculations in the framework of the valence force field method, we show that nitrogen atoms in diluted GaAs1−xNx tend to align along the [001] direction. In quaternary alloys Ga1−yInyAs1−xNx this tendency is observed only in “as-grown”
Autor:
Wolfgang Stolz, K. Hantke, J. Koch, T. Torunski, S. Reinhard, S. Borck, W. W. Rühle, Joerg Heber, Kerstin Volz, Bernardette Kunert
Publikováno v:
63rd Device Research Conference Digest, 2005. DRC '05..
Realizing monolithic optoelectronic integrated circuits (OIECs) on silicon substrate would open up an exciting and completely new field of applications, i.e. optical interconnects at the chip level. In the past a lot of effort has been devoted to the