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pro vyhledávání: '"T. Svimonishvili"'
Akademický článek
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Publikováno v:
IEEE Transactions on Plasma Science. 37:1537-1551
In this paper, total incident electron dose as an inherent parameter in secondary electron emission is experimentally demonstrated. A completely automated experimental setup allows for measuring of secondary electron yield (SEY) as a function of beam
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b9064537513425cb033f77bf1bad2bf
https://doi.org/10.1109/tps.2009.2022970
https://doi.org/10.1109/tps.2009.2022970
Autor:
Michael S. Gilmore, Prashanth Kumar, T. Svimonishvili, J. Gaudet, N. Zameroski, Edl Schamiloglu, C. Watts
Publikováno v:
IEEE Transactions on Plasma Science. 34:642-651
An experimental test facility has been established for measuring the secondary electron yield (SEY) of materials thought to be suitable for low yield vacuum electronic applications such as collectors in high-power microwave (HPM) tubes. Experiments c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f74dc3ab196254b7c438e11e400e22f3
https://doi.org/10.1109/tps.2006.875778
https://doi.org/10.1109/tps.2006.875778
Publikováno v:
2010 Abstracts IEEE International Conference on Plasma Science.
Although there has been much interest in the THz region since as early as the 1920s, this part of the spectrum still remains one of the least used1. The interest in terahertz is driven by various fields such as biology, medicine, homeland security, a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f517c7a65842a9a41d066ee2c871127
https://doi.org/10.1109/plasma.2010.5533976
https://doi.org/10.1109/plasma.2010.5533976
Publikováno v:
2009 IEEE International Conference on Plasma Science - Abstracts.
THz radiation straddles microwave and infrared bands (50 GHz – 10 THz), thus combining the penetrating power of lower-frequency waves and imaging capabilities of higher-energy infrared radiation. Since THz radiation is not absorbed by most dry, non
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95e9dc67eccacd5bd21e3816a3128e1a
https://doi.org/10.1109/plasma.2009.5227308
https://doi.org/10.1109/plasma.2009.5227308
Publikováno v:
2007 IEEE 34th International Conference on Plasma Science (ICOPS).
Summary form only given. Smith-Purcell (SP) radiation is produced when an electron beam passes over a metallic periodic structure and a continuous spectrum of modes associated with the beam is scattered by the grating. Most of the scattered modes are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::833a9b8edd1e1e1aee618918148a2d5f
https://doi.org/10.1109/ppps.2007.4346013
https://doi.org/10.1109/ppps.2007.4346013
Publikováno v:
2007 IEEE 34th International Conference on Plasma Science (ICOPS).
Summary form given only. Secondary electron emission (SEE) results from bombarding materials with electrons, atoms, or ions. When studying SEE, one is usually interested in determining the secondary electron yield, defined as the number of secondary
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc8b7799c5adc8dc360553af34bd2b3f
https://doi.org/10.1109/ppps.2007.4345836
https://doi.org/10.1109/ppps.2007.4345836
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
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Autor:
L.A. Bowers, T. Svimonishvili, N. Zameroski, H. Bosman, J. Gaudet, Edl Schamiloglu, Michael S. Gilmore, C. Watts, Prashanth Kumar
Publikováno v:
IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science.
Summary form only given. Over the last few years, there has been a great deal of interest in secondary electron emission (SEE) phenomena. SEE results from the interaction of materials with electrons, atoms, or ions. The amount of secondary emission d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da584daa19f3f3da393eb10185dcb983
https://doi.org/10.1109/plasma.2005.359242
https://doi.org/10.1109/plasma.2005.359242
Publikováno v:
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786).
One of the major problems affecting the efficiency of high-power microwave devices is that of secondary electron emission from the collector. It is a well known that the efficiency of these devices can be greatly improved by using depressed collector
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f59f48289a85ec929193e4db1134966
https://doi.org/10.1109/ivelec.2004.1316243
https://doi.org/10.1109/ivelec.2004.1316243