Zobrazeno 1 - 7
of 7
pro vyhledávání: '"T. R. Niedermayr"'
Ultrahigh energy resolution gamma-ray spectrometers for precision measurements of uranium enrichment
Publikováno v:
Journal of Radioanalytical and Nuclear Chemistry. 276:749-753
Superconducting gamma-ray detectors offer an order of magnitude higher energy resolution than conventional high-purity germanium detectors. This can significantly increase the precision of non-destructive isotope analysis for nuclear samples where li
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d882349b5a69bf153d7271bb41d993af
https://doi.org/10.1007/s10967-008-0628-4
https://doi.org/10.1007/s10967-008-0628-4
Autor:
H. Gregg, G. Overturf, D. H. G. Schneider, Alan V. Barnes, I. A. Mowat, J. W. McDonald, A. V. Hamza, Thomas Schenkel, M. W. Newman, T. R. Niedermayr
Publikováno v:
Journal of Energetic Materials. 19:101-118
Highly Charged Ion (HCI) Time-of-Flight (TOF) Secondary Ion Mass Spectrometry (SIMS) has been employed to analyze the changes in the surface composition of TATB caused by low energy electron, ultraviolet, and Gamma ray irradiation. Comparisons are ma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fcb45cb39b6ea26bc14db70a3c5990cd
https://doi.org/10.1080/07370650108216122
https://doi.org/10.1080/07370650108216122
Autor:
G. A. Machicoane, T. R. Niedermayr, M. W. Newman, J. W. McDonald, Thomas Schenkel, Alex V. Hamza, Thomas Schlathölter, Ronnie Hoekstra
Publikováno v:
The European Physical Journal D. 12:323-327
The emission of small (hydrogenated) carbon cluster ions CnHm + (n =2-22) upon highly charged Xeq+ (q =20-44) impact on C84 surfaces is studied by means of time-of-flight secondary ion mass spectrometry. The respective stage of hydrogenation/protonat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2abc5954a775ea2decefe58168d99420
https://doi.org/10.1007/s100530070028
https://doi.org/10.1007/s100530070028
Autor:
G. Machicoane, A. V. Hamza, Barney Lee Doyle, K. J. Wu, A. V. Barnes, J. W. McDonald, Thomas Schenkel, J.C. Banks, T. R. Niedermayr, M. W. Newman
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :65-75
Electronic sputtering in the interaction of slow (v < vBohr), highly charged ions (SHCI) with solid surfaces has been subject of controversial discussions for almost 20 years. We review results from recent studies of total sputtering yields and discu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52859d5e75a0c38d9777d1ac746ce696
https://doi.org/10.1016/s0168-583x(99)00880-0
https://doi.org/10.1016/s0168-583x(99)00880-0
Autor:
Thomas Schenkel, T. R. Niedermayr, M. Hattass, D. H. Schneider, J. W. McDonald, A. V. Hamza, A. V. Barnes, G. A. Machicoane, M. W. Newman
Publikováno v:
Physical Review Letters. 83:4273-4276
We have measured the deposition of potential energy of slow $(\ensuremath{\sim}6\ifmmode\times\else\texttimes\fi{}{10}^{5}\mathrm{m}/\mathrm{s})$, highly charged ions in solids with an ion implanted silicon detector. A large fraction (about $35%$ or
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff1c97c565b2fdcc7efcb50da59d690b
https://doi.org/10.1103/physrevlett.83.4273
https://doi.org/10.1103/physrevlett.83.4273
Autor:
Alex V. Hamza, A. V. Barnes, T. R. Niedermayr, Thomas Schenkel, J. W. McDonald, G. A. Machicoane, D. H. Schneider, M. W. Newman, M. Hattass
Publikováno v:
Physical Review Letters. 82:4795-4798
We report observations of nonequilibrium charge state distributions of slow, highly charged (33+{le} q{le}75+) ions after transmission of thin carbon foils. Charge equilibration times are determined directly from the dependencies of exit charge state
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34cac1bac5f8a5ecd0da0cf8052c6dca
https://doi.org/10.1103/physrevlett.82.4795
https://doi.org/10.1103/physrevlett.82.4795
Autor:
A. V. Barnes, M. W. Newmann, J. W. McDonald, A. V. Hamza, Thomas Schenkel, J. A. Tanis, T. R. Niedermayr, D. H. Schneider, G. Machicoane
Publikováno v:
Physical Review A. 65
Internal dielectronic excitation (IDE) is a correlated atomic physics process that takes place when the deexcitation of a Rydberg electron is accompanied by the excitation of a more tightly bound electron, resulting in a doubly excited inner-shell co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96b9cabe0a7cf6df603f502e335c8de2
https://doi.org/10.1103/physreva.65.042903
https://doi.org/10.1103/physreva.65.042903