Zobrazeno 1 - 9
of 9
pro vyhledávání: '"T. R. Bieler"'
Publikováno v:
Physical Review Special Topics. Accelerators and Beams, Vol 18, Iss 12, p 123501 (2015)
Large grain niobium (Nb) is being investigated for fabricating superconducting radiofrequency cavities as an alternative to the traditional approach using fine grain polycrystalline Nb sheets. Past studies have identified a surface damage layer on fi
Externí odkaz:
https://doaj.org/article/eefff6af45024dd08e1201377a7a7f98
Publikováno v:
Physical Review Special Topics. Accelerators and Beams, Vol 13, Iss 12, p 124701 (2010)
The performance of superconducting radio-frequency (SRF) resonant cavities made of bulk niobium is limited by nonlinear localized effects. Surface analysis of regions of higher power dissipation is thus of intense interest. Such areas (referred to as
Externí odkaz:
https://doaj.org/article/ef30b95df39147d08cbb8cfc4242bfc8
Autor:
T. R. Bieler, N. T. Wright, F. Pourboghrat, C. Compton, K. T. Hartwig, D. Baars, A. Zamiri, S. Chandrasekaran, P. Darbandi, H. Jiang, E. Skoug, S. Balachandran, G. E. Ice, W. Liu
Publikováno v:
Physical Review Special Topics. Accelerators and Beams, Vol 13, Iss 3, p 031002 (2010)
In the past decade, high Q values have been achieved in high purity Nb superconducting radio frequency (SRF) cavities. Fundamental understanding of the physical metallurgy of Nb that enables these achievements is beginning to reveal what challenges r
Externí odkaz:
https://doaj.org/article/6243b766b6fe4d69928d9e243b7e5c64
Publikováno v:
IEEE Transactions on Applied Superconductivity. 33:1-4
Autor:
Z. Zhao, M. R. Ruiz, J. Lu, M. A. Monclús, J. M. Molina-Aldareguía, T. R. Bieler, P. Eisenlohr
Publikováno v:
Experimental Mechanics. 62:731-743
Publikováno v:
Proceedings of the 1997 IEEE International Symposium on Electronics and the Environment. ISEE-1997.
Environmental concerns, increasing complexity, and demands for reliability of solder joints in electronic systems provide an impetus to find alternatives to existing lead-tin solder and fluxes in common use. Several practical obstacles need to be ove
Publikováno v:
Microscopy and Microanalysis. 5:882-883
Electron channeling contrast imaging (ECCI), performed using a scanning electron microscope, has been used to observe dislocations in bulk TiAl with a duplex microstructure. The ECCI technique is based on the dependence of the back-scattered electron
Publikováno v:
Superconductor Science & Technology; Nov2018, Vol. 31 Issue 11, p1-1, 1p
Publikováno v:
IOP Conference Series: Materials Science & Engineering; 12/4/2015, Vol. 82 Issue 1, p1-1, 1p