Zobrazeno 1 - 4
of 4
pro vyhledávání: '"T. N. Adam"'
Autor:
J. KOLODZEY, T. N. ADAM, R. T. TROEGER, P.-C. LV, S. K. RAY, I. YASSIEVICH, M. ODNOBLYUDOV, M. KAGAN
Publikováno v:
International Journal of Nanoscience. :171-176
Terahertz (THz) electroluminescence was produced by three different types of sources: intersubband transitions in silicon germanium quantum wells, resonant state transitions in boron-doped strained silicon germanium layers, and hydrogenic transitions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17141fc243d8d2a112f28fd5f0808ba2
https://doi.org/10.1142/s0219581x0400195x
https://doi.org/10.1142/s0219581x0400195x
Publikováno v:
Microscopy and Microanalysis. 20:252-253
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::39e7f59c4eaec4f03b4f048b63046319
https://doi.org/10.1017/s1431927614002980
https://doi.org/10.1017/s1431927614002980
Autor:
Kathryn T. Schonenberg, Paul Ronsheim, Michael A. Gribelyuk, T. N. Adam, V. Ontalus, Jun Yuan
Publikováno v:
Microscopy and Microanalysis. 16:568-569
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::99f33a55ed5ee28523ec8f3c07df94e4
https://doi.org/10.1017/s143192761005587x
https://doi.org/10.1017/s143192761005587x
Autor:
P. R. Ronsheim, Kathryn T. Schonenberg, T. N. Adam, V. Ontalus, L. Kimball, Michael A. Gribelyuk
Publikováno v:
Journal of Applied Physics. 110:063522
Microstructure of Si1-xCx films grown epitaxially onto Si wafers was studied. Clusters formed by Si and interstitial carbon were observed in Si1-xCx films by transmission electron microscopy. It was found that the cluster size increases with the tota
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ad042b1661469e0524aad7a61d84351
https://doi.org/10.1063/1.3630029
https://doi.org/10.1063/1.3630029