Zobrazeno 1 - 10
of 37
pro vyhledávání: '"T. Mitch Wallis"'
Autor:
T. Mitch Wallis, Charles A. E. Little, Richard A. Chamberlin, George L. Burton, Nathan D. Orloff, Christian J. Long, Kubilay Sertel
Publikováno v:
2022 99th ARFTG Microwave Measurement Conference (ARFTG).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d4ec06720c9ecf98bce6659da2449c3
https://doi.org/10.1109/arftg54656.2022.9896540
https://doi.org/10.1109/arftg54656.2022.9896540
Publikováno v:
IEEE Microwave Magazine. 21:36-51
The optical characterization of nanoscale objects is challenging due to the Abbe diffraction limit. This limit constrains the achievable spatial resolution of a conventional microscope using visible light to a 200 nm . 200 nm. The current era of nano
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb5902c6f1125d1f51e9fad67a0c7402
https://doi.org/10.1109/mmm.2020.3008305
https://doi.org/10.1109/mmm.2020.3008305
Autor:
Marco, Farina, T Mitch, Wallis
Publikováno v:
IEEE microwave magazine. 21(10)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::e96b0026195e08f80e1bd259e60bd4e3
https://pubmed.ncbi.nlm.nih.gov/34121937
https://pubmed.ncbi.nlm.nih.gov/34121937
Autor:
Marco Farina, T. Mitch Wallis
Publikováno v:
IEEE Microwave Magazine. 21:19-21
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6751d5cebc59779b7ee44bc0b8385cbb
https://doi.org/10.1109/mmm.2020.3008242
https://doi.org/10.1109/mmm.2020.3008242
Autor:
T. Karl Stupic, Mingzhong Wu, Hong X. Tang, Samuel Berweger, Stephen E. Russek, Houchen Chang, Na Zhu, Hans T. Nembach, Robert Tyrell-Ead, T. Mitch Wallis, Pavel Kabos
Publikováno v:
Journal of Magnetism and Magnetic Materials. 546:168870
We present images of spin-wave excitations in a patterned yttrium iron garnet (YIG) thin film obtained by use of near-field microwave microscopy, which can achieve spatial resolution as high as 50 nm. Visualization of magnetic excitations is an entic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70c32f027e724bb228a9fd37057bd746
https://doi.org/10.1016/j.jmmm.2021.168870
https://doi.org/10.1016/j.jmmm.2021.168870
Autor:
T. Mitch Wallis, Pavel Kabos
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1f514b635f6f506bc81ac497c36d737
https://doi.org/10.1017/9781316343098
https://doi.org/10.1017/9781316343098
Autor:
T. Mitch Wallis, Pavel Kabos
Publikováno v:
Measurement Techniques for Radio Frequency Nanoelectronics
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ea8feffcef83afc9935517d6e3305e6
https://doi.org/10.1017/9781316343098.006
https://doi.org/10.1017/9781316343098.006
Autor:
T. Mitch Wallis, Pavel Kabos
Publikováno v:
Measurement Techniques for Radio Frequency Nanoelectronics
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fd38f75fd41b5781be445c88c745365
https://doi.org/10.1017/9781316343098.001
https://doi.org/10.1017/9781316343098.001