Zobrazeno 1 - 10
of 113
pro vyhledávání: '"T. K. Sharma"'
Autor:
S. Haldar, V. K. Dixit, Geetanjali Vashisht, Shailesh Kumar Khamari, S. Porwal, T. K. Sharma, S. M. Oak
Publikováno v:
Scientific Reports, Vol 7, Iss 1, Pp 1-12 (2017)
Abstract Effect of charge carrier confinement and ultra-low disorder acquainted in AlGaAs/GaAs multi-quantum well system is investigated via Magneto-photoluminescence spectroscopy. Significant increase of effective mass is observed for the confined e
Externí odkaz:
https://doaj.org/article/f0742b7abd594fd68b37ff66ea0dd972
Autor:
S. K. Chetia, P. Rajput, R. S. Ajimsha, R. Singh, A. K. Das, R. Kumar, P. S. Padhi, A. K. Sinha, S. N. Jha, T. K. Sharma, P. Misra
Publikováno v:
Applied Physics A. 128
Publikováno v:
DAE SOLID STATE PHYSICS SYMPOSIUM 2019.
Publikováno v:
Journal of Physics D: Applied Physics. 54:495107
Publikováno v:
DAE SOLID STATE PHYSICS SYMPOSIUM 2018.
Autor:
U. K. Ghosh, A. K. Jaiswal, Geetanjali Vashisht, S. Porwal, T. K. Sharma, S. Haldar, V. K. Dixit, A. Khakha
Publikováno v:
DAE SOLID STATE PHYSICS SYMPOSIUM 2018.
A simple and cost-effective maskless-photolithography system is developed using a digital projector and a stereo-zoom optical microscope. The optical microscope is used to focus a highly divergent light from the projector into a smaller region of spa
Publikováno v:
DAE SOLID STATE PHYSICS SYMPOSIUM 2018.
Photoluminescence (PL) and Photoluminescence Excitation (PLE) measurements are performed on MOVPE grown InAlN/AlN/InGaN/GaN/Sapphire High Electron Mobility Transistor Structures. Features associated with InAlN barrier layer, InGaN channel layer and G
Autor:
Shailesh K. Khamari, S. Haldar, V. K. Dixit, T. K. Sharma, R. Roychowdhury, Geetanjali Vashisht, Heena Darji
Publikováno v:
AIP Conference Proceedings.
The effect of surface and interface states of various GaAs based structures such as n+GaAs, n-n+GaAs and p-i-n GaAs are investigated for understanding the detector performance. These structures are grown by metal organic vapor phase epitaxy (MOVPE).