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pro vyhledávání: '"T. J. Mulrooney"'
Autor:
M. G. R. Thomson, R. Liu, D. P. Rosenfeld, D. E. A. Smith, E. A. Gere, C. M. Rose, T. J. Mulrooney, D. S. Alles, N. Paras, R. J. Nielsen, F. Leone, C. J. Biddick, J. T. Clemens, L. R. Harriott, R. M. Richman, R. J. Collier, J. H. Bruning
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 5:47
EBES4 is an electron‐beam exposure machine designed for accurate submicron lithography with good throughput. It can write on optical and x‐ray mask substrates and directly on semiconductor substrates. Standard pattern data are preprocessed using