Zobrazeno 1 - 10
of 43
pro vyhledávání: '"T. Garba"'
Publikováno v:
IEEE International Reliability Physics Symposium (IRPS 2023)
IEEE International Reliability Physics Symposium (IRPS 2023), Mar 2023, Monterey, United States. ⟨10.1109/IRPS48203.2023.10117885⟩
IEEELink
IEEE International Reliability Physics Symposium (IRPS 2023), Mar 2023, Monterey, United States. ⟨10.1109/IRPS48203.2023.10117885⟩
IEEELink
International audience; Dynamic off-state stress for RF applications is investigated via integrated test circuits to enable GHz level testing. We have performed characterization of test circuits to ensure the dynamic stress signal waveform integrity,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8145e89588fe5b7bf9959ddd9fd9338
https://hal.science/hal-04105262
https://hal.science/hal-04105262
Autor:
F. Cacho, A. Bravaix, T. Garba Seybou, H. Pitard, X. Federspiel, T. Kumar, F. Giner, A. Michard, D. Celeste, B. Miller, V. Dhanda, A. Varshney, V. Tripathi, J. Kumar
Publikováno v:
International Integrated reliability Workshop (IIRW) 2022
International Integrated reliability Workshop (IIRW) 2022, Oct 2022, South Lake Tahoe, CA, USA, France. pp.1-7, ⟨10.1109/IIRW56459.2022.10077885⟩
International Integrated reliability Workshop (IIRW) 2022, Oct 2022, South Lake Tahoe, CA, USA, France. pp.1-7, ⟨10.1109/IIRW56459.2022.10077885⟩
Aging phenomena are first evidenced at device level to cell level considering a precise knowledge of the leading degradation mechanisms and interactions useful for processing optimization focusing performance vs. reliability requirements. Digital to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f4340eabdf0b1829474c4ec655593e2a
https://hal.science/hal-04124032/document
https://hal.science/hal-04124032/document
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
IRPS
IEEE International Reliability Physics Symposium (IRPS)
2021 IEEE International Reliability Physics Symposium (IRPS)
2021 IEEE International Reliability Physics Symposium (IRPS), Mar 2021, Monterey, France. pp.1-5, ⟨10.1109/IRPS46558.2021.9405214⟩
IEEE International Reliability Physics Symposium (IRPS)
2021 IEEE International Reliability Physics Symposium (IRPS)
2021 IEEE International Reliability Physics Symposium (IRPS), Mar 2021, Monterey, France. pp.1-5, ⟨10.1109/IRPS46558.2021.9405214⟩
International audience; The study of parameter drift due to interface defect generation in “Off” mode or near Vth is very complex, because it is often concomitant with hot hole trapping which induces turnaround effects. Improving device aging mod
Publikováno v:
International Research Journal of Pure and Applied Chemistry. 17:1-15
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, 2021, Microelectronics Reliability, 126, pp.114342. ⟨10.1016/j.microrel.2021.114342⟩
Microelectronics Reliability, 2021, Microelectronics Reliability, 126, pp.114342. ⟨10.1016/j.microrel.2021.114342⟩
International audience; Improving device aging models requires to consider hot-carrier degradation (HCD) between On/Off modes and interaction of these different damage rate mechanisms as well as the dynamic effects. As DC characterization of HCD mode
Publikováno v:
Simulation Modelling Practice and Theory. 77:338-349
Inelastic neutron scattering is an experimental technique widely used to investigate the vibrational characteristics of materials in condensed matter research. While coherent inelastic neutron scattering is typically restricted to single-crystal samp
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
International Research Journal of Pure and Applied Chemistry. 4:486-493
In this research work the level of the metals: Pb, Cd, Zn, and Cu were determined in soil samples collected within Maiduguri Metropolis. Samples were collected from places of high anthropogenic activity such as automobile maintenance workshop (AMW),