Zobrazeno 1 - 6
of 6
pro vyhledávání: '"T. F. Luera"'
Publikováno v:
Proceedings of the Seventh ASTM-Euratom Symposium on Reactor Dosimetry ISBN: 9789401052351
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f9d54bc9bf650e2a1804d8842352a82
https://doi.org/10.1007/978-94-011-2781-3_77
https://doi.org/10.1007/978-94-011-2781-3_77
Publikováno v:
Proceedings of the Seventh ASTM-Euratom Symposium on Reactor Dosimetry ISBN: 9789401052351
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a61d6ae18e5aabb97e4d7cf3f7ed67a2
https://doi.org/10.1007/978-94-011-2781-3_71
https://doi.org/10.1007/978-94-011-2781-3_71
Publikováno v:
Nuclear Technology. 35:33-39
The thermal shock effects that occur in a fast burst reactor (FBR) during its operation are analyzed. The thermoelastic displacement equation for radial motion is solved for a reactor initially at rest and having stress-free boundaries. Numerical res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ddf6fc6fbd7cb1017ac5a330ae12b0f
https://doi.org/10.13182/nt77-a31848
https://doi.org/10.13182/nt77-a31848
Autor:
T. F. Luera
Publikováno v:
Journal of Applied Physics. 51:5792-5796
Channeled‐proton‐induced x rays (CPIX) were used to measure displacement damage produced in sapphire (α‐Al2O3) by ion bombardment at room temperature. A method based on dechanneling theory was developed for the interpretation of CPIX results i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8414e780cb92e367fac19d276e65a70
https://doi.org/10.1063/1.327536
https://doi.org/10.1063/1.327536
Autor:
D. C. Arwood, T. W. Kerlin, G. P. Mulholland, T. F. Luera, A. De La Paz, Balabhadra Misra, Victor A. Maroni, Mohamed A. Abdou, Jungchung Jung, F. D’Annucci, C. Sari, G. Schumacher, Paul B. Abramson, E. D. Clayton, H. K. Clark, D. W. Magnuson, J.H. Chalmers, Gordon Walker, N. Ketzlach, Ryohei Kiyose, C. L. Brown, D. R. Smith, R. Artigas, C. Devillers, P. Blum, T. Shimooke, K. Matsumoto, J. T. A. Roberts, E. Smith, N. Fuhrman, D. Cubicciotti, U. Benedict, G. Giacchetti, Hj. Matzke, K. Richter, H. E. Schmidt, Mark B. Triplett, E. C. Beahm, C.A. Culpepper, John W. Wilson, Fred M. Denn, W. Van Witzenburg, L.G.J. Janssen, J. Prij
Publikováno v:
Nuclear Technology. 35:1-7
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9423679fd897ff3591fb8122dcf3c11b
https://doi.org/10.13182/nt77-a31845
https://doi.org/10.13182/nt77-a31845
Publikováno v:
Ion Implantation in Semiconductors 1976 ISBN: 9781461341987
Radiation damage produced by room temperature ion implantation into single crystal Al 2O3 has been studied by a combination of optical absorption spectroscopy, Rutherford backscattering-channeling (RBC) and channeled proton-induced x-ray (CPIX) measu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02828e3366a167ece7f57ce5ebb09a87
https://doi.org/10.1007/978-1-4613-4196-3_32
https://doi.org/10.1007/978-1-4613-4196-3_32