Zobrazeno 1 - 10
of 42
pro vyhledávání: '"T. E. Whall"'
Publikováno v:
Microscopy of Semiconducting Materials 2001 ISBN: 9781351074629
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50a5be7e493ae2f9a9d120defaf9d33b
https://doi.org/10.1201/9781351074629-38
https://doi.org/10.1201/9781351074629-38
Autor:
T. E. Whall
Publikováno v:
Contemporary Physics. 33:369-381
Ultra-thin doping layers of ≤ 1 nm in width may now be incorporated into semiconductors, to form two-dimensional disordered systems. The low-temperature electrical properties and some device applications of these so-called delta layers are discusse
Autor:
V.A.M. Brabers, T. E. Whall
Publikováno v:
Landolt-Börnstein-Group III Condensed Matter ISBN: 3540538771
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd414915e274fa943ff47a1538badc01
https://doi.org/10.1007/10028068_1
https://doi.org/10.1007/10028068_1
Autor:
V.A.M. Brabers, T. E. Whall
Publikováno v:
Landolt-Börnstein-Group III Condensed Matter ISBN: 3540538771
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8870978854facbfb4952fa6fe404a7d4
https://doi.org/10.1007/10028068_4
https://doi.org/10.1007/10028068_4
Autor:
V.A.M. Brabers, T. E. Whall
Publikováno v:
Landolt-Börnstein-Group III Condensed Matter ISBN: 3540538771
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6c97a63e125ef75420122bf6809290f
https://doi.org/10.1007/10028068_11
https://doi.org/10.1007/10028068_11
Autor:
V.A.M. Brabers, T. E. Whall
Publikováno v:
Landolt-Börnstein-Group III Condensed Matter ISBN: 3540538771
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6735ca5513d11cde1609c89b7376e7ff
https://doi.org/10.1007/10028068_12
https://doi.org/10.1007/10028068_12
Autor:
V.A.M. Brabers, T. E. Whall
Publikováno v:
Landolt-Börnstein-Group III Condensed Matter ISBN: 3540538771
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5395ab4182960536bcc85c7b6f5c6cb
https://doi.org/10.1007/10028068_2
https://doi.org/10.1007/10028068_2
Autor:
V.A.M. Brabers, T. E. Whall
Publikováno v:
Landolt-Börnstein-Group III Condensed Matter ISBN: 3540538771
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff8de37fd323fd1ab76b5e153e954909
https://doi.org/10.1007/10028068_6
https://doi.org/10.1007/10028068_6
Autor:
V.A.M. Brabers, T. E. Whall
Publikováno v:
Landolt-Börnstein-Group III Condensed Matter ISBN: 3540538771
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c85540e9b67a48b2ae4aa82d523fd7b
https://doi.org/10.1007/10028068_5
https://doi.org/10.1007/10028068_5
Publikováno v:
Proceedings. International Semiconductor Conference.
The maximum entropy mobility spectrum analysis (ME-MSA) method has been developed on the basis of a maximum entropy (ME) principle. It allows one to calculate a smooth electrical conductivity versus mobility plot ("mobility spectrum") from the classi