Zobrazeno 1 - 10
of 32
pro vyhledávání: '"T. E. Tiwald"'
Autor:
Kirill I. Bolotin, Joshua D. Caldwell, Sampath Gamage, Thomas G. Folland, Alireza Fali, Yohannes Abate, Marquez Howard, Nadeemullah A. Mahadik, T. E. Tiwald
Publikováno v:
ACS Photonics. 8:175-181
Infrared dielectric properties of muscovite mica, one of the first van der Waals crystals, exfoliated on silicon and SiO2 substrates is studied using near-field nano-FTIR spectroscopy. The spectra ...
Autor:
Michael Stadermann, Jianing Sun, James N. Hilfiker, Chantel Aracne-Ruddle, Jeffrey S. Hale, T. E. Tiwald, Philip E. Miller
Publikováno v:
Applied Surface Science. 421:508-512
It is a well-known challenge to determine refractive index (n) from ultra-thin films where the thickness is less than about 10 nm [1,2]. We discovered an interesting exception to this issue while characterizing spectroscopic ellipsometry (SE) data fr
Autor:
Nina Hong, Henri J. Lezec, Cheng Zhang, L. Jay Guo, Zhong Zhang, Amit Agrawal, T. E. Tiwald, James N. Hilfiker, Chengang Ji, Wenqi Zhu, Stefan Schoeche, Xi Chen
Hyperbolic metamaterials are optical materials characterized by highly anisotropic effective permittivity tensor components having opposite signs along orthogonal directions. The techniques currently employed for characterizing the optical properties
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94eadd1797d71d1233b7d5adbf3a8a40
https://europepmc.org/articles/PMC6463533/
https://europepmc.org/articles/PMC6463533/
Autor:
T. E. Tiwald, James N. Hilfiker
Publikováno v:
Spectroscopic Ellipsometry for Photovoltaics ISBN: 9783319753751
Spectroscopic ellipsometry (SE) is commonly used to measure the optical constants of thin films and bulk materials. The optical constants vary with wavelength, which is referred to as dispersion. Rather than independently determine the optical consta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f66e0a910940378169ff083a35f8798d
https://doi.org/10.1007/978-3-319-75377-5_5
https://doi.org/10.1007/978-3-319-75377-5_5
Autor:
Tino Hofmann, T. E. Tiwald, M. Solinsky, Keith B. Rodenhausen, Mathias Schubert, M. Guericke, Natale J. Ianno, Matthew Scott Wagner, A. Sarkar
Publikováno v:
Thin Solid Films. 519:2821-2824
We report on a combinatorial approach to study the formation of ultra-thin organic films using in-situ spectroscopic ellipsometry and quartz crystal microbalance methods. In contrast to the quartz crystal microbalance, which is sensitive to the total
Autor:
Mathias Schubert, Keith B. Rodenhausen, Matthew Scott Wagner, M. Solinsky, Angela K. Pannier, B.A. Duensing, Tino Hofmann, Tadas Kasputis, T. E. Tiwald
Publikováno v:
Thin Solid Films. 519:2817-2820
Self-assembled monolayers (SAMs) formed via chemisorption are important for a variety of surface enhancement and biological applications. We demonstrate that combinatorial spectroscopic ellipsometry (SE) and quartz crystal microbalance with dissipati
Autor:
Neha Singh, Steven M. Smith, T. E. Tiwald, James N. Hilfiker, Diana Convey, Jeffrey H. Baker, Harland G. Tompkins
Publikováno v:
Thin Solid Films. 516:7979-7989
Spectroscopic Ellipsometry (SE) is routinely used to measure thickness and optical constants of dielectric and semiconductor films. However, unique results for thin absorbing films, such as metals, are difficult to ensure. SE enables simultaneous det
Autor:
T. E. Tiwald, John A. Woollam, W.H. Nosal, Sabyasachi Sarkar, Daniel W. Thompson, Anuradha Subramanian
Publikováno v:
Surface and Interface Analysis. 39:747-751
Optical properties of spin-cast chitosan films were determined in the vacuum ultraviolet (VUV) through visible regions of the spectrum using spectroscopic ellipsometry. The onset of absorption in the ultraviolet was determined for chitosan films modi
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:1605-1609
In this work we discuss a method of determining film thickness for film/substrate combination where the index of refraction of the film and substrate in the transparent spectral regions is almost identical. Common examples of this situation are organ
Publikováno v:
physica status solidi (a). 202:1688-1692
The refractive index N = n + ik of the protein bovine carbonic anhydrase (BCA) adsorbed in porous silicon layers is determined using infrared spectroscopic ellipsometry. Five absorption bands in the amide region are resolved. The distribution of the