Zobrazeno 1 - 6
of 6
pro vyhledávání: '"T. E. Dyer"'
Autor:
T. E. Dyer, Jiří Stuchlík, Jiri Oswald, Z. Chvoj, K.M.A. El-Kader, J.M. Marshall, I. Ulrych, O. Borusı́k, Ivan Pelant, Jan Kočka, Vladimír Cháb
Publikováno v:
Thin Solid Films. 276:306-309
We report on room-temperature photoluminescence (PL) properties of light-emitting silicon produced by excimer (XeCl, ArF) laser crystallization of undoped hydrogenated amorphous silicon (a-Si:H). PL intensity increases linearly with the number of app
Publikováno v:
Philosophical Magazine B. 72:323-333
The structural and electrical properties of undoped and doped microcrystalline silicon carbide (μc-SiC) thin films prepared by excimer (ArF) laser crystallization of plasma-enhanced chemical vapour deposited hydrogenated amorphous silicon carbide (a
Publikováno v:
Thin Solid Films. 263:99-104
In this work we discuss picosecond photoinduced absorption (PA) decay curves obtained for amorphous and polycrystalline (furnace crystallised and laser crystallised) silicon thin films. The PA temporal decay curves are recorded using a fast modulatio
Publikováno v:
Philosophical Magazine B. 69:509-523
We present novel data on optoelectronic properties observed in the amorphous-to-polycrystalline silicon (polysilicon) phase transition, and the effect on as-crystallized films of a simple post-hydrogenation treatment. The polysilicon thin films were
Publikováno v:
Journal of Non-Crystalline Solids. :813-816
Highly conductive (∼10 −4 (Ωcm) −1 ) and wide band gap (∼2.0eV) carrier injection layers of a-SiC:H have been prepared by rf plasma enhanced chemical vapour deposition (PECVD) using the hydrogen dilution technique. These materials have been
Publikováno v:
Journal of Non-Crystalline Solids. :1001-1004
We report on the opto-electronic and structural properties of polysilicon produced by excimer (ArF) laser crystallisation of undoped hydrogenated amorphous silicon (a-Si:H). Micro structure and average grain size are determined by TEM and electron di