Zobrazeno 1 - 10
of 28
pro vyhledávání: '"T. Dosluoglu"'
Publikováno v:
Solid-State Electronics. 36:273-277
The diode equation has been written as a set of state equations of the form e = f( e , x) where f(e, x) is a non-linear function and e is the state vector which comprises of electric field, quasi-Fermi levels and the currents as variables. These stat
Autor:
R. Solanki, T. Dosluoglu
Publikováno v:
Solid State Communications. 85:243-247
One dimensional semiconductor device equations are solved for the double-heterojunction p-i-n diode using a state variable model. Using this model, Poisson equation and the current density equation are solved simultaneously in a single integration st
Publikováno v:
IEEE Transactions on Electron Devices. 40:1484-1495
Process and device parameters are characterized in detail for a 30-GHz f/sub T/ submicrometer double poly-Si bipolar technology using a BF/sub 2/-implanted base with a rapid thermal annealing (RTA) process. Temperature ramping during the emitter poly
Publikováno v:
Journal of Crystal Growth. 106:643-650
Relationship between the flow rates of the precursor gases and the composition of In1−xGaxAs epilayers on InP has been examined. Based on experimental data a linear model has been developed to predict this relationship. This model has been used to
Publikováno v:
Semiconductor Science and Technology. 9:1276-1278
A high-performance lateral p-n photodiode in LPCVD polysilicon has been successfully fabricated and characterized. The device is shown to have a response time of 30 ps, i.e. a 3 dB cut-off frequency of 5.3 GHz, which we believe is the fastest speed r
Publikováno v:
1991., IEEE International Sympoisum on Circuits and Systems.
Polysilicon thin-film transistors (TFTs) and TFT-CMOS circuits are processed, characterized and modeled for integrated driver applications in high definition display systems. The I-V characteristics of n- and p-channel TFTs are simulated by adjusting
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Autor:
R. Solanki, T. Dosluoglu
Publikováno v:
Journal of Applied Physics. 69:7327-7329
Carrier concentration and mobility of undoped InGaAs layers grown on InP via organometallic vapor phase epitaxy have been investigated. The mobility limits imposed by various scattering mechanisms were studied over the temperature range 40 to 300 K.
Publikováno v:
Journal of Crystal Growth. 94:978-980
Laser induced pyrolytic process is used to selectively grow epitaxial GaP microstructures on silicon. The precursor gases are trimethylgallium and tertiarybutylphosphine, a new phosphorus donor.
Publikováno v:
Applied Physics Letters. 55:738-740
An ArF excimer laser has been used to achieve homoepitaxy of GaP at 500 °C using trimethylgallium and tertiarybutylphosphine as the precursor gases. Dependence of epitaxial growth on several parameters is examined. It is found that at 500 °C, in th