Zobrazeno 1 - 10
of 19
pro vyhledávání: '"T. Daniel Loveless"'
Autor:
Joshua H. Tyler, Mohamed K. M. Fadul, Matthew R. Hilling, Donald R. Reising, T. Daniel Loveless
Publikováno v:
Discover Internet of Things, Vol 4, Iss 1, Pp 1-21 (2024)
Abstract Specific Emitter Identification (SEI) has been put forward as an Internet of Things (IoT) Physical Layer Security (PLS) approach for its abilities to detect, characterize, and identify wireless emitters by exploiting distinct, inherent, and
Externí odkaz:
https://doaj.org/article/28d2c04a771a482d99aa466d2276fd63
Publikováno v:
EURASIP Journal on Information Security, Vol 2024, Iss 1, Pp 1-25 (2024)
Abstract Internet of Things (IoT) deployments are anticipated to reach 29.42 billion by the end of 2030 at an average growth rate of 16% over the next 6 years. These deployments represent an overall growth of 201.4% in operational IoT devices from 20
Externí odkaz:
https://doaj.org/article/17afae0ca7ce4b6a8a77b17cdb6d9cd7
Publikováno v:
MILCOM 2022 - 2022 IEEE Military Communications Conference (MILCOM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eba20727fef16ec7fca50f2bc2a67560
https://doi.org/10.1109/milcom55135.2022.10017570
https://doi.org/10.1109/milcom55135.2022.10017570
Publikováno v:
IEEE Internet of Things Journal. 8:8356-8371
It is estimated that the number of Internet-of-Things (IoT) devices will reach 75 billion in the next five years. Most of those currently and soon-to-be deployed devices lack sufficient security to protect themselves and their networks from attacks b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::248ccdfb0f5e0dec66dd5a5888c8d8d3
https://doi.org/10.1109/jiot.2020.3045305
https://doi.org/10.1109/jiot.2020.3045305
Publikováno v:
IEEE Transactions on Information Forensics and Security. 16:2381-2396
The Internet of Things (IoT) is a collection of Internet connected devices capable of interacting with the physical world and computer systems. It is estimated that IoT will consist of more than seventy five billion devices by the year 2025. In addit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80843ec35c058491bfe473bd66954fa8
https://doi.org/10.1109/tifs.2021.3054524
https://doi.org/10.1109/tifs.2021.3054524
Publikováno v:
Internet of Things ISBN: 9783031209352
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b6691e162582353aa7d18824cd6da892
https://doi.org/10.1007/978-3-031-20936-9_22
https://doi.org/10.1007/978-3-031-20936-9_22
Publikováno v:
GLOBECOM
Radio-Frequency Distinct Native Attributes (RFDNA) fingerprinting is a Specific Emitter Identification (SEI) approach developed as a mechanism for enhancing wireless network security. RF-DNA fingerprinting exploits unintentional and distinctively uni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a270bd67aa1e2e839bf6e808f3e0b7d2
https://doi.org/10.1109/globecom38437.2019.9014225
https://doi.org/10.1109/globecom38437.2019.9014225
Publikováno v:
WCNC
The Internet of Things is a collection of Internet connected devices capable of interacting with the physical world and computer-based systems and is estimated to consist of 20 to 50 billion devices by the year 2020. Due to these numbers and the fact
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ea71d7e2caf0f800feb53cecef8bc8c
https://doi.org/10.1109/wcnc.2019.8885421
https://doi.org/10.1109/wcnc.2019.8885421
Publikováno v:
2019 SoutheastCon.
A multiphysics simulation methodology is presented for the analysis of transient radiation effects in photonic integrated devices and circuits. Electrical and optical simulators are coupled by computing steady-state optical solutions at various time
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8dd3bc8c4c12b1265a9ec46f6a6d0ca
https://doi.org/10.1109/southeastcon42311.2019.9020662
https://doi.org/10.1109/southeastcon42311.2019.9020662
Autor:
R. C. Quinn, Jeffrey S. Kauppila, T. Daniel Loveless, Ronald D. Schrimpf, J. A. Maharrey, Dennis R. Ball, J. D. Rowe, Michael L. Alles, Lloyd W. Massengill
Publikováno v:
IEEE Transactions on Nuclear Science. 62:1589-1598
A new geometry-aware single-event enabled compact model for sub-50 nm partially depleted silicon-on-insulator MOSFETs is presented. The model extends the bias-dependent single-event modeling methods with an integrated parasitic BJT using the SPICE Gu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::823462825b7beaedec4828e661eb46ad
https://doi.org/10.1109/tns.2015.2443116
https://doi.org/10.1109/tns.2015.2443116