Zobrazeno 1 - 3
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pro vyhledávání: '"T. D. Boone"'
Publikováno v:
IEEE Transactions on Electron Devices. 55:1529-1534
A technique for imaging the 2-D transport of free charge in semiconductor structures is used to directly map electric field distributions in operating devices. Transport imaging is demonstrated in a scanning electron microscope operating in spot mode
Autor:
A J, Ricco, T D, Boone, Z H, Fan, I, Gibbons, T, Matray, S, Singh, H, Tan, T, Tian, S J, Williams
Publikováno v:
Biochemical Society transactions. 30(2)
Plastic microfluidic array platforms and synergistic multiplexed assay chemistries are under development for a variety of applications, including assays of gene expression, proteomics, genotyping, DNA sequencing and fragment analysis, sample preparat
Publikováno v:
Applied Physics Letters. 88:163509
A scanning electron microscope technique is used, in combination with an optical imaging system, to measure minority carrier diffusion length in a heavily doped GaAs double heterostructure. Diffusion and drift of charge are imaged. A diffusion length