Zobrazeno 1 - 10
of 192
pro vyhledávání: '"T. B. Wu"'
Publikováno v:
Materials Science and Technology. 33:363-369
Carbon partitioning was applied to treat high-carbon high-alloy steel. Equilibrium concentration of carbon was studied by constrained carbon equilibrium (CCE) criterion and modified model (CCEA) which took the effect of alloying elements on the carbo
Publikováno v:
Journal of Alloys and Compounds. 506:98-102
This work investigated the structural and luminescent properties of YAG:Ce (Ce-doped Y 3 Al 5 O 12 ) thin films grown at different deposition conditions. The YAG:Ce phosphor thin films were deposited on quartz at room temperature by rf magnetron sput
Publikováno v:
Current Nanoscience. 6:169-172
Autor:
Chi-Liang Chen, T. W. Huang, S. M. Rao, T. B. Wu, Phillip M. Wu, B. H. Mok, K. W. Ye, Maw-Kuen Wu, Chung-Ting Ke, K. J. Wang, J. Y. Luo, Albert M. Chang, M. C. Ling, F. C. Hsu, D. C. Yan
Publikováno v:
Crystal Growth & Design. 9:3260-3264
Crystals of FeSe0.88 and FeSeMn0.1 have been grown from KCl solutions. Crystals measuring 2−3 mm across and 0.1−0.3 mm thick grow with a hexagonal plate like habit. Powder X-ray diffraction (XRD) measurements show strong peaks corresponding to th
Publikováno v:
physica status solidi c. 4:4376-4379
The top-configuration Co(y)/IrMn(90 A) exchange-biasing phenomenon has been studied by sputtering method with two conditions: (a) the substrate temperature (Ts) was kept at room temperature (RT) only, and (b) Ts = RT with an in-plane field (h) = 500
Publikováno v:
Journal of Physics: Condensed Matter. 15:963-969
(Pb, Nb)(Zr, Sn, Ti)O3 antiferroelectric (AFE) thin films have been fabricated on LaNiO3/Pt/Ti/SiO2/Si wafers using a sol–gel process. The electric field-induced antiferroelectric-to-ferroelectric (AFE–FE) phase transformation behaviour and its d
Publikováno v:
Textures and Microstructures. 35:283-290
The tilting of a specimen may not only result in defocusing effect, but also in a change of irradiated volume during texture measurement for thin films and coatings by using X-ray diffraction. The influence on diffraction intensity has to be consider
Autor:
T. B. Wu, Eugene V. Colla, T. F. Hung, Yingbang Yao, Z. K. Xu, Xin Li, Jiwei Zhai, Haydn Chen
Publikováno v:
Journal of Applied Physics. 92:3990-3994
Antiferroelectric PbZrO3 (PZ) films have been fabricated on LaNiO3/Pt/Ti/SiO2/Si substrates using a sol-gel process. The films with perovskite structure showed highly 〈001〉 preferred orientation. An antiferroelectric phase was identified by the p
Publikováno v:
Journal of Materials Research. 15:115-124
Thin films of highly (100) textured fine-grain (lateral grain size ≅0.1 to 0.15 μm) PbZrxTi1−xO3 (PZT) (x = 0 to 0.7) were grown on conductive perovskite LaNiO3-buffered platinized Si substrates by metalorganic chemical vapor deposition. Domain
Publikováno v:
Applied Physics Letters. 81:3621-3623
Antiferroelectric (Pb,Nb)(Zr,Sn,Ti)O3 thin films were deposited via a sol-gel process on LaNiO3-coated silicon substrates. Films showed a strong (001) preferred orientation upon annealing at 500–700 °C for 30 min. The dependence of electrical prop