Zobrazeno 1 - 10
of 55
pro vyhledávání: '"T. A. Temofonte"'
Publikováno v:
Journal of Applied Physics. 71:204-210
Hg1−xCdxTe layers have been grown by organometallic vapor‐phase epitaxy at 350 °C on {211}‐oriented substrates, including CdTe, (CdZn)Te, and GaAs, with the emphasis on lattice matching for improved structural quality films. Characterization i
Autor:
T. A. Temofonte, K. F. Schoch
Publikováno v:
Journal of Applied Physics. 65:1350-1355
Nickel and lead phthalocyanine (NiPc and PbPc) thin films prepared by vacuum sublimation have been investigated for use as gas sensors. High sensitivity (25 ppb), reversibility, and very fast response time (∼ seconds) have been demonstrated for det
Publikováno v:
Solar Cells. 1:251-259
Metal-insulator-silicon (MIS) solar cells with and without grain boundaries were fabricated using polycrystalline Czochralski silicon. Scanned laser spot methods were used to provide high resolution photocurrent and surface reflection images of these
Publikováno v:
Applied Physics Letters. 54:2015-2017
Two groups of interface electrons, one of very high mobility (105 cm2 /V s), have been found in p‐type Hg1−x Cdx Te of low band gap (x≤0.2) from studies of the Hall effect up to 50 kG. Both groups are associated with the growth interface. The n
The objective of this program is to understand fundamental aspects of grain boundary influences on photocurrent collection and opposing current transport in polycrystalline silicon cells. Results of the program are expected to aid in optimizing thin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a750ed5a03731ac4e2b88750bf6006c
https://doi.org/10.2172/6810037
https://doi.org/10.2172/6810037
Autor:
J. R. Szedon, T. A. Temofonte
Publikováno v:
9th Reliability Physics Symposium.
Potential propagation over the surface of hermetically sealed or plastic coated semiconductor products may produce failure. A special test structure has been used to characterize the rate of propagation as a function of a number of parameters: humidi
Publikováno v:
Chemischer Informationsdienst. 3
A method for characterizing electrical stability of organic coatings in microelectronic applications
Autor:
T. A. Temofonte, J. R. Szedon
Publikováno v:
1971 EIC 10th Electrical Insulation Conference.
With the surface test vehicle structure used for the experiments described in this report, significant changes in potential over device surfaces have been measured at distances of 10 to 40 mils from the driving electrodes. This potential propagation
Publikováno v:
In Microelectronics Reliability 1972 11(1):14-14
Publikováno v:
Journal of The Electrochemical Society. 119:1424