Zobrazeno 1 - 3
of 3
pro vyhledávání: '"T. A. Kruze"'
Publikováno v:
Physica Status Solidi (a). 36:81-88
The structure of surface silicon layers heavily irradiated with nitrogen ions depending on dose and subsequent annealing temperature is investigated by transmission electron microscopy. It is shown that in the absence of annealing the produced Si3N4
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2835b3901b4c259f3f50f9bff7d97925
https://doi.org/10.1002/pssa.2210360108
https://doi.org/10.1002/pssa.2210360108
Publikováno v:
Chemischer Informationsdienst. 6
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe5342e6637833b7f81c0f360a8905bb
https://doi.org/10.1002/chin.197549040
https://doi.org/10.1002/chin.197549040
Publikováno v:
Chemischer Informationsdienst. 6
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be2105ddc378dcaa963cf791f5b6ed5b
https://doi.org/10.1002/chin.197532047
https://doi.org/10.1002/chin.197532047