Zobrazeno 1 - 1
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pro vyhledávání: '"T. A. H. Mir"'
Publikováno v:
Semiconductors. 54:1577-1582
In the present report, influence of annealing temperature variations on the optical, morphological, and structural properties of chemically deposited nanocrystalline zinc-selenide thin films is studied employing an X-ray diffractometer, scanning elec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9acfdde0b10526f4cf3840a664b752ed
https://doi.org/10.1134/s1063782620120234
https://doi.org/10.1134/s1063782620120234
