Zobrazeno 1 - 10
of 75
pro vyhledávání: '"T. Moiseenko"'
Autor:
Sergey M. Zharkov, Vladimir V. Yumashev, Evgeny T. Moiseenko, Roman R. Altunin, Leonid A. Solovyov, Mikhail N. Volochaev, Galina M. Zeer, Nataliya S. Nikolaeva, Oleg V. Belousov
Publikováno v:
Nanomaterials, Vol 13, Iss 22, p 2925 (2023)
The effect of the aluminum layer on the kinetics and mechanism of aluminum-induced crystallization (AIC) of amorphous silicon (a-Si) in (Al/a-Si)n multilayered films was studied using a complex of in situ methods (simultaneous thermal analysis, trans
Externí odkaz:
https://doaj.org/article/c4af935be1514a99aac1308c2390a3be
Solid-State Reaction in Cu/a-Si Nanolayers: A Comparative Study of STA and Electron Diffraction Data
Autor:
Evgeny T. Moiseenko, Vladimir V. Yumashev, Roman R. Altunin, Galina M. Zeer, Nataliya S. Nikolaeva, Oleg V. Belousov, Sergey M. Zharkov
Publikováno v:
Materials; Volume 15; Issue 23; Pages: 8457
The kinetics of the solid-state reaction between nanolayers of polycrystalline copper and amorphous silicon (a-Si) has been studied in a Cu/a-Si thin-film system by the methods of electron diffraction and simultaneous thermal analysis (STA), includin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::431a539ffabade06bac2f68a26b9be87
https://pubmed.ncbi.nlm.nih.gov/36499953
https://pubmed.ncbi.nlm.nih.gov/36499953
Autor:
Evgeny T. Moiseenko, Vladimir V. Yumashev, Roman R. Altunin, Leonid A. Solovyov, Mikhail N. Volochaev, Oleg V. Belousov, Sergey M. Zharkov
Publikováno v:
Materialia. 28:101747
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b929f682efff3e4c09be5bd65cf0fe1
https://doi.org/10.1016/j.mtla.2023.101747
https://doi.org/10.1016/j.mtla.2023.101747
Publikováno v:
Physics of the Solid State. 62:708-713
Based on the results of in situ electron diffraction study of the solid-state reaction and electrical resistivity measurements on the Al/Ag thin films with an atomic ratio of Al : Ag = 1 : 3, the temperature of the reaction onset has been established
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab0a3bfc7c21e6957b3145d6842e353f
https://doi.org/10.1134/s1063783420040034
https://doi.org/10.1134/s1063783420040034
Publikováno v:
Metallurgical and Materials Transactions A. 51:1428-1436
Solid state reaction processes in Cu/Al thin films have been studied using the methods of in situ electron diffraction and electrical resistivity measurements. The solid state reaction in the Cu/Al thin films has been found to begin already at 88 °C
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::895b45e0e52d2a8c21346a25a50df4d3
https://doi.org/10.1007/s11661-019-05602-5
https://doi.org/10.1007/s11661-019-05602-5
Publikováno v:
Physics of the Solid State. 62:200-205
The processes of phase formation during a solid-state reaction between Fe and Al nanolayers have been investigated by the in situ electron diffraction method. It is established that the solid-state reaction at the interface between iron and aluminum
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c8dc33c359c8682b804b3d7fab58f74
https://doi.org/10.1134/s1063783420010059
https://doi.org/10.1134/s1063783420010059
Publikováno v:
Journal of Solid State Chemistry. 269:36-42
To understand the mechanism of mass transfer during solid state reactions and order-disorder transitions the formation processes of CuAuI and L10-FePd ordered structures at solid state reactions in Cu/Au и Fe/Pd bilayer thin films have been carried
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::353dc75c67b9a7079f5baf59e30bbd65
https://doi.org/10.1016/j.jssc.2018.09.009
https://doi.org/10.1016/j.jssc.2018.09.009
Publikováno v:
Physics of the Solid State. 60:1413-1418
A sequence of phases forming during the solid-phase reaction in Al/Pt bilayer thin films has been investigated by in situ electron diffraction. It is shown that the amorphous PtAl2 phase forms first during the solid-phase reaction initiated by heatin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb354bee83406007aa8199c3e9d8639c
https://doi.org/10.1134/s106378341807003x
https://doi.org/10.1134/s106378341807003x
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Autor:
Galina M. Zeer, Roman R. Altunin, Vladimir V. Yumashev, Oleg V. Belousov, Leonid A. Solovyov, Mikhail N. Volochaev, Sergey M. Zharkov, Evgeny T. Moiseenko
Publikováno v:
Journal of Alloys and Compounds. 871:159474
A solid-state reaction process in Ag/Al multilayer thin films has been investigated by the methods of in situ electron diffraction, simultaneous thermal analysis, transmission electron microscopy and X-ray diffraction with the aim of studying the pha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfd7f2b7a7ec5c557b5226f43321ca12
https://doi.org/10.1016/j.jallcom.2021.159474
https://doi.org/10.1016/j.jallcom.2021.159474