Zobrazeno 1 - 10
of 17
pro vyhledávání: '"T S Kamilov"'
Autor:
T. S. Kamilov, A. S. Rysbaev, V. V. Klechkovskaya, A. S. Orekhov, Sh. Kh. Dzhuraev, A. S. Kasymov
Publikováno v:
Eurasian Journal of Physics and Functional Materials, Vol 2, Iss 4, Pp 360-366 (2021)
The paper considers the influence of a transition amorphous layer at the interface between the higher manganese silicide (HMS) Mn 4 Si 7 and silicon doped with manganese (Si ) on the photoelectric properties of heterostructures. The role of the initi
Externí odkaz:
https://doaj.org/article/0ced00b9d18845c8bc4891a2546edfe4
Publikováno v:
International Journal of Modern Physics B. 37
There arises the formation of thin films of cobalt monosilicide (CoSi) deposited into the base surface of SiO2/Si (111) using magnetron ion-plasma sputtering and subsequent thermal annealing. It was found that, in addition to the formation of CoSi si
Autor:
T. S. Kamilov, Vera V. Klechkovskaya, A. S. Rysbaev, I. R. Bekpulatov, B. D. Igamov, Andrey S. Orekhov
Publikováno v:
Applied Solar Energy. 55:380-384
The effect of the amorphous transition layer at the interface between Mn4Si7 and silicon doped with manganese on the photoelectric properties of heterostructures is considered. It is found that the precipitated Mn atoms on the silicon surface are gro
Publikováno v:
Eurasian Journal of Physics and Functional Materials, Vol 2, Iss 4, Pp 360-366 (2018)
The paper considers the influence of a transition amorphous layer at the interface between the higher manganese silicide (HMS) Mn 4 Si 7 and silicon doped with manganese (Si ) on the photoelectric properties of heterostructures. The role of the initi
Autor:
E. V. Rakova, T. S. Kamilov, N. A. Arkharova, Vera V. Klechkovskaya, Andrey S. Orekhov, Anton S. Orekhov
Publikováno v:
Nanotechnologies in Russia. 11:610-616
The structure and composition of higher manganese silicide (HMS) films on Si(111) substrate are studied by high-resolution transmission electron microscopy, electron diffraction, and energy-dispersive X-ray spectroscopy. The formation of Mn4Si7 HMS f
Publikováno v:
Semiconductors. 49:1281-1284
The features of current instabilities in Mn4Si7–Si:Mn–Mn4Si7 and Mn4Si7–Si:Mn–M heterojunctions are investigated at low temperatures and upon “intrinsic” illumination with hv > 1.12 eV. It is shown that low-frequency self-oscillations rel
The structural features of higher manganese-silicide films obtained by the diffusion doping of single-crystal silicon substrates with manganese vapor in a sealed cell and a flow-through quartz reactor with continuous pumping are comparatively analyze
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::52c613badb329681ac2b0d126a883888
https://hdl.handle.net/20.500.12445/336
https://hdl.handle.net/20.500.12445/336
Publikováno v:
Technical Physics. 59:1833-1838
The photoconduction amplification and quenching in the Mn4Si7-Si〈Mn〉-Mn4Si7 and Mn4Si7-Si〈Mn〉-M heterostructures are studied. It is shown that, at low temperatures, the high-ohmic base region of the HMS-Si〈Mn〉-HMS or HMS-Si〈Mn〉-M stru
Publikováno v:
Technical Physics. 58:1182-1188
The kinetics of photocurrent is studied in the presence of the intrinsic irradiation at hν ≥ 1.12 eV in the Mn4Si7-Si〈Mn〉-Mn4Si7 and Mn4Si7-Si〈Mn〉-M heterojunctions at relatively high applied voltages. It is demonstrated that photocurrent,
Publikováno v:
Technical Physics. 56:1423-1428
The current-voltage characteristics of Mn4Si7-Si〈Mn〉-Mn4Si7 and Mn4Si7-Si〈Mn〉-M photodiodes are studied experimentally. The current passage mechanism under illumination with hν ≥ Eg is considered. The role of a contact to Mn4Si7 in the pro