Zobrazeno 1 - 5
of 5
pro vyhledávání: '"T S J Lammerink"'
Publikováno v:
41st International Conference on Micro-and Nano-Engineering, MNE 2015
This paper presents a technique for measuring the ratio between two on-chip capacitances which largely eliminates the influence of drift in the electronic measurement circuit. Measurement results on an inline capacitive pressure sensor are presented.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b1bfb6c67df9a14794959b6168ab031
https://research.utwente.nl/en/publications/b2bcc234-6fd1-4eed-af3d-c41c60d6de0f
https://research.utwente.nl/en/publications/b2bcc234-6fd1-4eed-af3d-c41c60d6de0f
Publikováno v:
Proceedings SENSOR 2011.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fbbb5128bd16b324494d8f220d0fb09
https://doi.org/10.5162/sensor11/a4.1
https://doi.org/10.5162/sensor11/a4.1
Autor:
R A Brookhuis, R G P Sanders, K Ma, T S J Lammerink, M J de Boer, G J M Krijnen, R J Wiegerink
Publikováno v:
Journal of Micromechanics & Microengineering; Feb2015, Vol. 25 Issue 2, p1-1, 1p
Autor:
J Haneveld, T S J Lammerink, M J de, R G P Sanders, A Mehendale, J C Lotters, M Dijkstra, R J Wiegerink
Publikováno v:
Journal of Micromechanics & Microengineering; Dec2010, Vol. 20 Issue 12, p125001-125001, 1p
Publikováno v:
Journal of Micromechanics & Microengineering; Jul2005, Vol. 15 Issue 7, pS132-S138, 1p