Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Szu-Pang Mu"'
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24:1675-1687
This paper presents a model-fitting framework to correlate the on-chip measured ring-oscillator counts to the chip’s maximum operating speed. This learned model can be included in an auto test equipment (ATE) software to predict the chip speed for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb8fa1f997ea2517f1467413ae54420b
https://doi.org/10.1109/tvlsi.2015.2478921
https://doi.org/10.1109/tvlsi.2015.2478921
Publikováno v:
ITC-Asia
This paper presents a framework which can avoid the lengthy system test by utilizing machine-learning techniques to classify parts into different DVFS bins based on the results collected at CP and FT test only. The core machine-learning techniques in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5524a5d8f96eccb1e26762c9b0b825ac
https://doi.org/10.1109/itc-asia.2018.00016
https://doi.org/10.1109/itc-asia.2018.00016
Autor:
Yi-Ming Wang, Wen-Hsiang Chang, Szu-Pang Mu, Min-Hsiu Tsai, Ming-Tung Chang, Mango C.-T. Chao
Publikováno v:
ICCAD
In previous literatures, many approaches use ring oscillators or other process monitors to correlate the chip's maximum operating frequency (F max ). But none of them focus on the placement of these on-chip process monitors (OPMs) on a chip. The plac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b169b104ef0e6c278e665fb0e37c68a
https://doi.org/10.1145/2966986.2967076
https://doi.org/10.1145/2966986.2967076
Autor:
Yen-Chih Chiu, Szu-Pang Mu, Chien-Hsueh Lin, Mango C.-T. Chao, Li-De Chen, Cheng-Hong Tsai, Wen-Hsiang Chang
Publikováno v:
ISPD
As technology node keeps scaling and design complexity keeps increasing, power distribution networks (PDNs) require more routing resource to meet IR-drop and electro-migration (EM) constraints. This paper presents a design flow to generate a PDN that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::12e81b30d3c0a0502640dfd573d2e85c
https://doi.org/10.1145/2872334.2872353
https://doi.org/10.1145/2872334.2872353
Autor:
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango C.-T. Chao, Shi-Hao Chen, Chih-Mou Tseng, Tsung-Ying Tsai
Publikováno v:
2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a8092cc2e5bcb41aa017eb06e31a25a
https://doi.org/10.1109/iccad.2010.5654118
https://doi.org/10.1109/iccad.2010.5654118
Autor:
Szu-Pang Mu, Mango C.-T. Chao
Publikováno v:
VTS
This paper presents a single-test-input test-decompression scheme, named STSD, which utilize the technique of test-slice duplication to reduce the test-data volume as well as the signal transitions along scan paths. The encoding of STSD scheme focuse
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b879fa10cd8144550ab64d400882802
https://doi.org/10.1109/vts.2010.5469591
https://doi.org/10.1109/vts.2010.5469591