Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Szu-Jui Chou"'
Publikováno v:
Digital Health, Vol 9 (2023)
Background Human immunodeficiency virus (HIV) screeners have limited experience of interacting with trans people. The application of communication platforms between them to empower HIV screeners’ trans-related cultural competence remains unknown. O
Externí odkaz:
https://doaj.org/article/3317bef2c85c43a0b39487b4a7b81070
Autor:
Szu-Jui Chou, 周思睿
95
As IC process geometries shrink to 65nm and below, the post-CMP dielectric thickness variation control becomes a dominant technique for manufacturability. To improve CMP quality and enhance the yield, layout uniformity is necessary. Dummy met
As IC process geometries shrink to 65nm and below, the post-CMP dielectric thickness variation control becomes a dominant technique for manufacturability. To improve CMP quality and enhance the yield, layout uniformity is necessary. Dummy met
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/89134200887122922118
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 28:193-206
As nanometer technology advances, the post chemical-mechanical polishing (CMP) topography variation control becomes crucial for manufacturing closure. To improve the CMP quality, dummy-feature filling is typically performed by foundries after the rou
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::23334b1b325d051054c3613d22ed27a2
https://doi.org/10.1109/tcad.2008.2009156
https://doi.org/10.1109/tcad.2008.2009156
Autor:
Y.-W. Chen, Szu-Jui Chou, Yao-Wen Chang, Shih-Yi Yuan, Hung-Yi Liu, Chung-Wei Lin, Sy-Yen Kuo, Chih-Hung Liu
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 27:1363-1375
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high current densities in a small device and burn it out, so on-chip protection circuit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a200b85d3c2db75e6196635b5e67918
https://doi.org/10.1109/tcad.2008.925779
https://doi.org/10.1109/tcad.2008.925779
Publikováno v:
2007 IEEE/ACM International Conference on Computer-Aided Design.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::332bd751c4775bc79cfc37a83aac91d9
https://doi.org/10.1109/iccad.2007.4397368
https://doi.org/10.1109/iccad.2007.4397368
Publikováno v:
Lecture Notes in Computer Science ISBN: 9783540744412
PATMOS
PATMOS
The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern circuit designs may suffer from design uncertainties, unpredictable in the design p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49a32e9fcbe8167b0cc8df0ce251a8af
https://doi.org/10.1007/978-3-540-74442-9_15
https://doi.org/10.1007/978-3-540-74442-9_15
Autor:
Sy-Yen Kuo, Chih-Hung Liu, Chung-Wei Lin, Szu-Jui Chou, Wei-Ting Tu, Yao-Wen Chang, Hung-Yi Liu
Publikováno v:
ICCAD
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densities in a small device and burn it out, so on-chip protection circuits for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7fd276bf6481506441a972a28c9f378b
https://doi.org/10.1109/iccad.2006.320166
https://doi.org/10.1109/iccad.2006.320166
Autor:
Chih-Hung Liu, Hung-Yi Liu, Chung-Wei Lin, Szu-Jui Chou, Yao-Wen Chang, Sy-Yen Kuo, Shih-Yi Yuan, Yu-Wei Chen
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Aug2008, Vol. 27 Issue 8, p1363-1375, 13p