Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Syuan Miao Lai"'
Autor:
Cheng Yi Liu, Ting Fu Zhang, Fan Ching Chien, Song Yu Wang, Thi Anh Nguyet Nguyen, Chun Kai Huang, Syuan Miao Lai, Chi Chen, Kun Yu Lai, Chia Hua Lin
Publikováno v:
ACS Applied Nano Materials. 4:2614-2620
Surface-enhanced Raman scattering (SERS) is a technique that can deliver label-free, real-time, and multiplex detection of target molecules. However, the development of this potential tool has been...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d992f1c82b6afd56cb9f6182407d675c
https://doi.org/10.1021/acsanm.0c03265
https://doi.org/10.1021/acsanm.0c03265
Publikováno v:
ACS Applied Nano Materials. 3:2997-3003
Large-area and single-crystalline gold films with (111) orientation are grown on MoS2 surfaces at 400 °C. Superior crystalline quality and continuity are observed on MoS2 over the films grown on mi...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e7aa276fc212a11f510667d712160f5
https://doi.org/10.1021/acsanm.0c00262
https://doi.org/10.1021/acsanm.0c00262
Autor:
Syuan-miao Lai, 賴宣妙
100
ZnO nanoparticles were deposited on Si, SiO2, and Cu clusters by reactive ion beam sputter deposition. As the deposition time decreases or deposition temperature increases, the density of ZnO nanoparticle decreases. XRD analysis shows that t
ZnO nanoparticles were deposited on Si, SiO2, and Cu clusters by reactive ion beam sputter deposition. As the deposition time decreases or deposition temperature increases, the density of ZnO nanoparticle decreases. XRD analysis shows that t
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/zumthp
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 29:051805
Nano-scale ripples on Si (100) substrates were prepared by argon ion beam sputtering at 6, 8, and 10 keV with an ion fluence of 5 × 1017 ions/cm2. The spatial wavelength of the nano-scale ripple increases as the ion beam energy increases, regardless
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54e282ca416b9959550e2efc73ac2eff
https://doi.org/10.1116/1.3633689
https://doi.org/10.1116/1.3633689
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Sep2011, Vol. 29 Issue 5, p051805-1-051805-4, 4p