Výsledky vyhledávání - "Sylvia Jy Lewis"

Innovative Nondestructive Compositional Mapping of Trace-Elements and Contaminants at Micron-Scale in Wafers and Packaging

Autor: Sharon Chen, Sylvia Jy Lewis, Ian Spink, Vladimir Semenov, Janos Kirz, S. H. Lau, Benjamin Stripe, Wenbing Yun, David Reynolds, Alan Lyon

Publikováno v: International Symposium for Testing and Failure Analysis.

We describe a technique for mapping the distribution and concentrations of trace elements, most notably with capabilities of achieving 1-10 parts per million sensitivities within 1 second and at

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::60834e7ca65760ed92d731718ccea7f3
https://doi.org/10.31399/asm.cp.istfa2016p0485

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A New Type of Super Bright Laboratory X-ray Source

Autor: Sylvia Jy Lewis, Janos Kirz, Ian Spink, Benjamin Stripe, Wenbing Yun, Alan Lyon, Dave Reynolds, Sharon Chen

Publikováno v: High-Brightness Sources and Light-Driven Interactions.

We are developing a revolutionary new type of x-ray source that is designed to be more than 10X brighter than the brightest rotating anode x-ray source currently available. Additionally, the new x-ray source will have substantially wider selection of

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::fc3bdc9247dce595481f8eb24b16a7fe
https://doi.org/10.1364/euvxray.2016.em4a.2

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Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity

Autor: David Reynolds, Sylvia Jy Lewis, Richard Ian Spink, S. H. Lau, Janos Kirz, Alan Lyon, Benjamin Stripe, Wenbing Yun

Publikováno v: Microscopy and Microanalysis. 23:44-45

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4fa7fecb85d3218c8e889da29e415354
https://doi.org/10.1017/s1431927617000903

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A New Approach to Microns-Resolution Trace Element and Mineralogy Mapping at PPM Sensitivity for Digital Rock and Geological Research

Autor: Alan Lyon, Sharon Chen, Benjamin Stripe, S. H. Lau, Wenbing Yun, David Reynolds, Richard Ian Spink, Sylvia Jy Lewis

Publikováno v: Microscopy and Microanalysis. 23:2176-2177

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5b47eaab9bcbf51cef1d4b01a3935384
https://doi.org/10.1017/s1431927617011540

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Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation

Autor: S. H. Lau, Benjamin Stripe, David Reynolds, Sharon Chen, Alan Lyon, Wenbing Yun, Sylvia Jy Lewis, Vladimir Semenov, Richard Ian Spink

Publikováno v: Microscopy and Microanalysis. 22:118-119

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8d6a9f387b703a4b6544c6ae20ba32d9
https://doi.org/10.1017/s1431927616001446

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Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe

Autor: Alan Lyon, Benjamin Stripe, David Reynolds, Richard Ian Spink, S. H. Lau, Sharon Chen, Sylvia Jy Lewis, Wenbing Yun

Publikováno v: Microscopy and Microanalysis. 22:436-437

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::dc06c5ceee6e119e3522b592498e82db
https://doi.org/10.1017/s1431927616003032

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