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Autor:
Sylvere Bienvenue Dion, Don Jean François Ulrich Agre, Akpa Marcel Agnero, Jérémie Thouakesseh Zoueu
Publikováno v:
Photonics, Vol 10, Iss 2, p 163 (2023)
Three-dimensional reconstruction in brightfield microscopy is challenging since a 2D image includes from in-focus and out-of-focus light which removes the details of the specimen’s structures. To overcome this problem, many techniques exist, but th
Externí odkaz:
https://doaj.org/article/40239dbee1d14ebf8df6937c4b6b6fa8
