Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Sylvain Labouré"'
Autor:
Patrice Bras, Christian Morawe, Sylvain Labouré, François Perrin, Amparo Vivo, Raymond Barrett
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 4, Pp 708-716 (2023)
Differential deposition by DC magnetron sputtering was applied to correct for figure errors of X-ray mirrors to be deployed on low-emittance synchrotron beamlines. During the deposition process, the mirrors were moved in front of a beam-defining aper
Externí odkaz:
https://doaj.org/article/141f85541779422d937a254d94e9a396
Publikováno v:
Advances in X-Ray/EUV Optics and Components XVII.
Publikováno v:
Advances in X-Ray/EUV Optics and Components XVI.
The figure errors of an x-ray mirror were reduced by differential deposition of C/Pt layered structures. Different apertures were inserted into the particle beam to correct height errors on variable length scales down to less than 10 mm. The required
Autor:
Christian Morawe, François Perrin, Raymond Barrett, Sylvain Labouré, A. Vivo, Jean Christophe Peffen
Publikováno v:
Journal of Synchrotron Radiation. 26:1872-1878
The surface figure error of a hard X-ray mirror was improved by combining differential deposition and off-line metrology tools. Thin Cr layers were deposited on flat substrates by DC magnetron sputtering. The substrates were moved in front of a beam-
Publikováno v:
Microscopy and Microanalysis. 24:522-525
Autor:
François Perrin, Sylvain Labouré, A. Vivo, Jean-Christophe Peffen, Raymond Barrett, Christian Morawe
Publikováno v:
Advances in X-Ray/EUV Optics and Components XIV.
Differential deposition techniques were applied to reduce the figure error of x-ray mirrors. Cr layers were sputtered on flat substrates that were moved with variable speed in front of a beam defining aperture. The required velocity profile was calcu
Autor:
Christian Morawe, Jean-Christophe Peffen, Narong Chanlek, Ratchadaporn Supruangnet, Phakkhananan Pakawanit, Dechmongkhon Kaewsuwan, Sylvain Labouré
Publikováno v:
Applied Surface Science. 509:144920
In the context of multilayer based X-ray optics developments, thin layered systems of C/[Pt/B4C] multilayers and C/Pt/B4C/Cr stacks with variable cap layer thicknesses were deposited on Si wafers using DC magnetron sputtering. The samples were studie
Autor:
Julie Villanova, Sylvain Labouré, Christophe L. Martin, Luc Salvo, Pierre Lhuissier, Gema Martínez-Criado, David Jauffrès, Rémi Tucoulou, R. Daudin, Richi Kumar
Publikováno v:
Microscopy and Microanalysis
Microscopy and Microanalysis, Cambridge University Press (CUP), 2018, 24 (S2), pp.450-451. ⟨10.1017/s1431927618014496⟩
'Microscopy and Microanalysis ', vol: 24, pages: 450-451 (2018)
Microscopy and Microanalysis, Cambridge University Press (CUP), 2018, 24 (S2), pp.450-451. ⟨10.1017/s1431927618014496⟩
'Microscopy and Microanalysis ', vol: 24, pages: 450-451 (2018)
International audience; X-ray computed tomography (CT) is a very powerful technique that provides nondestructively direct access to the three-dimensional morphology of a specimen. It is extensively used in different domains like medicine, paleontolog
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e765d13d0149ffe2a2a3a544375c15a
https://hal.archives-ouvertes.fr/hal-01872651
https://hal.archives-ouvertes.fr/hal-01872651
Autor:
Christophe L. Martin, Luc Salvo, Gema Martínez-Criado, Pierre Lhuissier, Siyu Lou, Julie Villanova, R. Daudin, Sylvain Labouré, David Jauffrès, Rémi Tucoulou
Publikováno v:
Materials Today
Materials Today, Elsevier, 2017, 20 (7), pp.354-359. ⟨10.1016/j.mattod.2017.06.001⟩
Digital.CSIC. Repositorio Institucional del CSIC
instname
Materials Today, Elsevier, 2017, 20 (7), pp.354-359. ⟨10.1016/j.mattod.2017.06.001⟩
Digital.CSIC. Repositorio Institucional del CSIC
instname
The performance of many advanced materials is determined by the arrangement of their nanostructure which requires ever more precise characterization. In this respect, X-ray computed tomography (CT) is a powerful technique to investigate material prop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3f194cecd5e9e84c5d3ec40773a5f43d
https://hal.archives-ouvertes.fr/hal-01678681/document
https://hal.archives-ouvertes.fr/hal-01678681/document
Autor:
R. Baker, John Morse, Cyril Guilloud, Gema Martínez-Criado, Sylvain Labouré, Yves Dabin, Rémi Tucoulou, Sylvain Bohic, E. Gagliardini, Cédric Cohen, Valentin Valls, Julie Villanova, Damien Salomon, Jussi-Petteri Suuronen, Raymond Barrett
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
Journal of Synchrotron Radiation
'Journal of Synchrotron Radiation ', vol: 23, pages: 344-352 (2016)
instname
Journal of Synchrotron Radiation
'Journal of Synchrotron Radiation ', vol: 23, pages: 344-352 (2016)
ID16B is a versatile hard X-ray nanoprobe devoted to X-ray nano-analysis. It combines X-ray fluorescence, X-ray diffraction, X-ray absorption spectroscopy and 2D/3D X-ray imaging techniques.
Within the framework of the ESRF Phase I Upgrade Progr
Within the framework of the ESRF Phase I Upgrade Progr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5b80b6d9e351e604c6f49b4201cc72d7
http://hdl.handle.net/10261/186406
http://hdl.handle.net/10261/186406