Zobrazeno 1 - 10
of 142
pro vyhledávání: '"Sying Jyan Wang"'
Publikováno v:
Integration. 89:185-196
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::39f10d2fe499fc7e52158ab14cc0d17b
https://doi.org/10.1016/j.vlsi.2022.11.013
https://doi.org/10.1016/j.vlsi.2022.11.013
Autor:
Katherine Shu-Min Li, Xu-Hao Jiang, Leon Li-Yang Chen, Sying-Jyan Wang, Andrew Yi-Ann Huang, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 35:291-299
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0539e6330261f546bc3b47802a367540
https://doi.org/10.1109/tsm.2022.3159246
https://doi.org/10.1109/tsm.2022.3159246
Autor:
Katherine Shu-Min Li, Leon Li-Yang Chen, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yeh Tsai, Ken Chau-Cheung Cheng, Gus Chang-Hung Han, Chen-Shiun Lee, Jwu E. Chen, Hsing-Chung Liang, Chung-Lung Hsu
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 35:272-281
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e63787231752b535207658a9b31591e0
https://doi.org/10.1109/tsm.2022.3146857
https://doi.org/10.1109/tsm.2022.3146857
Publikováno v:
2022 IEEE 31st Asian Test Symposium (ATS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e4767104828ad16e6d22c581da73f01
https://doi.org/10.1109/ats56056.2022.00028
https://doi.org/10.1109/ats56056.2022.00028
Publikováno v:
2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0bbacd2a389b97ff32adb87c41e44ef8
https://doi.org/10.1109/iet-iceta56553.2022.9971494
https://doi.org/10.1109/iet-iceta56553.2022.9971494
Publikováno v:
2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82bd6d61329abd0dc3d1fe1f6b0bfe99
https://doi.org/10.1109/iet-iceta56553.2022.9971560
https://doi.org/10.1109/iet-iceta56553.2022.9971560
Autor:
Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yen Tsai, Chen-Shiun Lee
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 35:372-374
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa5dcaeb9afcf95a7e0222f9e7d36e51
https://doi.org/10.1109/tsm.2022.3145855
https://doi.org/10.1109/tsm.2022.3145855
Autor:
Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e80df864d449350e90727216aed3a14d
https://doi.org/10.1109/itc50671.2022.00070
https://doi.org/10.1109/itc50671.2022.00070
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de66d4fac02ca250de7a30e10811cd74
https://doi.org/10.1109/itc50671.2022.00071
https://doi.org/10.1109/itc50671.2022.00071
Publikováno v:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems. 11:306-318
The Physical Unclonable Function (PUF) has been proposed for the identification and authentication of devices and cryptographic key generation. A strong PUF provides an extremely large number of device-specific challenge-response pairs (CRP) which ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3206fb15bfe8095ca6e029c00408c473
https://doi.org/10.1109/jetcas.2021.3062413
https://doi.org/10.1109/jetcas.2021.3062413