Zobrazeno 1 - 10
of 43
pro vyhledávání: '"Syam Prasid"'
Publikováno v:
Power Electronics and Drives, Vol 9, Iss 1, Pp 272-291 (2024)
A quasi-Z-source network is used to boost the DC bus voltage of a voltage source two-level H-bridge inverter to increase the voltage gain. With the increase in the DC bus voltage, the common mode voltage (CMV) also increases. The CMV is reduced using
Externí odkaz:
https://doaj.org/article/60e8a9288ed1457781e5d099da23d3f9
Publikováno v:
Power Electronics and Drives, Vol 9, Iss 1, Pp 205-219 (2024)
Minimisation of AC grid side input power factor angle for a ‘matrix converter (MC)’ improves the efficiency of the grid. Input volt-ampere requirement is minimum if the current drawn by the ‘MC’ is sinusoidal and input displacement power fact
Externí odkaz:
https://doaj.org/article/dca7a654df804142bed77ac53ed7eb79
Publikováno v:
Power Electronics and Drives, Vol 9, Iss 1, Pp 142-160 (2024)
The presence of low frequency components in the common mode voltage can cause harmful electromagnetic interference. A critical study on various causes of low frequency components in the common mode voltage of a space vector pulse width modulated Quas
Externí odkaz:
https://doaj.org/article/5a78a222659a495691b3b50e33c1b1d3
Autor:
Bandyopadhyay, Gautam1 (AUTHOR), Syam, Prasid1 (AUTHOR) ps@ee.iiests.ac.in
Publikováno v:
Sādhanā: Academy Proceedings in Engineering Sciences. Jun2024, Vol. 49 Issue 2, p1-8. 8p.
Publikováno v:
In Engineering Science and Technology, an International Journal April 2022 28
Publikováno v:
Journal of the Institution of Engineers (India): Series B; Oct2024, Vol. 105 Issue 5, p1241-1258, 18p
Autor:
Mulo, Tanmoy1 (AUTHOR) tmulo.nit.dgp@gmail.com, Syam, Prasid1 (AUTHOR), Choudhury, Amalendu Bikash1 (AUTHOR)
Publikováno v:
Electrical Engineering. Jun2023, Vol. 105 Issue 3, p1923-1935. 13p.
Publikováno v:
In Applied Soft Computing June 2016 43:520-534
Publikováno v:
2016 IEEE First International Conference on Control, Measurement & Instrumentation (CMI); 1/1/2016, p42-47, 6p
Publikováno v:
2016 IEEE First International Conference on Control, Measurement & Instrumentation (CMI); 1/1/2016, p36-41, 6p