Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Sven Weerdenburg"'
Publikováno v:
Light: Science & Applications, Vol 13, Iss 1, Pp 1-12 (2024)
Abstract Ptychographic extreme ultraviolet (EUV) diffractive imaging has emerged as a promising candidate for the next generationmetrology solutions in the semiconductor industry, as it can image wafer samples in reflection geometry at the nanoscale.
Externí odkaz:
https://doaj.org/article/86731cceb0e94d2ba210411692b29b50
Autor:
Maxim Tschernajew, Steffen Hädrich, Robert Klas, Martin Gebhardt, Roland Horsten, Sven Weerdenburg, Sergey Pyatchenkov, Wim Coene, Sven Breitkopf, Oliver Herrfurth, Jan Rothhardt, Tino Eidam, Jens Limpert
Publikováno v:
Optica High-brightness Sources and Light-driven Interactions Congress 2022.
We present a highly stable, easy-to-use HHG source delivering a record photon flux of >1011 photons/s at 69eV-75eV, being tunable to approx. 100eV which will be used for future photon-hungry applications.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67d89bc716984db985e32daad16cf047
https://doi.org/10.1364/euvxray.2022.eth3a.3
https://doi.org/10.1364/euvxray.2022.eth3a.3
Publikováno v:
Optica High-brightness Sources and Light-driven Interactions Congress 2022.
We demonstrate our beamline using a table-top HHG EUV source for lensless imaging application in reflection m ode. The sample reflection function is reconstructed using an auto-differentiation based ptychographic algorithm built on TensorFlow platfor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04b5d42de2f5ca6c8ae2abc67c2e4211
https://doi.org/10.1364/euvxray.2022.ew4a.2
https://doi.org/10.1364/euvxray.2022.ew4a.2
Autor:
Tobias G. Brevé, Mike Filius, Tim Groeneveld, Rienk Eelkema, Stefan van der Griend, Antonia G. Denkova, Sven Weerdenburg
Stimuli-responsive soft materials enable controlled release of loaded drug molecules and biomolecules. Controlled release of potent chemotherapeutic or immunotherapeutic agent is crucial to reduce unwanted side effects. In an effort to develop contro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::661cdf79bd4decac3b04b3f4889683c5
https://doi.org/10.26434/chemrxiv-2021-0spz9
https://doi.org/10.26434/chemrxiv-2021-0spz9
Autor:
Maxim Tschernajew, Steffen Haedrich, Robert Klas, Martin Gebhardt, Roland Horsten, Sven Weerdenburg, Sergey Pyatchenkov, Wim Coene, Christian Gaida, Sven Breitkopf, Jan Rothhardt, Tino Eidam, Jens Limpert
Publikováno v:
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XXI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::89a9396165a0bb123ea8288aa4f35a38
https://doi.org/10.1117/12.2577496
https://doi.org/10.1117/12.2577496