Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Sven Kirbach"'
Autor:
Sukhrob Abdulazhanov, Maximilian Lederer, C. Mart, Konrad Seidel, Lukas M. Eng, David Lehninger, Ricardo Olivo, Sven Kirbach, Thomas Kampfe
Publikováno v:
physica status solidi (RRL) – Rapid Research Letters
Autor:
Sven Kirbach, C. Mart, Malte Czernohorsky, Wenke Weinreich, Maximilian Lederer, Sophia Eßlinger, T. Wallmersperger
Publikováno v:
Applied Physics Letters. 118:012904
Piezoelectric thin films are of current interest in science and industry for highly integrated nano-electro-mechanical-systems and sensor devices. In this study, the dependence of the piezoelectric properties on the doping concentration in Si:HfO2 th
Autor:
R. Hoffmann, C. Mart, Thomas Kampfe, Malte Czernohorsky, Wenke Weinreich, Sophia Eßlinger, Kati Kühnel, Sven Kirbach, Lukas M. Eng
Publikováno v:
Advanced Electronic Materials. 6:1901015
The in‐plane piezoelectric response of 20 nm thick Si‐doped HfO2 is examined by exploiting thermal expansion of the substrate upon rapid temperature cycling. The sample is heated locally by a deposited metal film, and the subsequently registered
Autor:
L. Roy, C. Mart, Sven Kirbach, Konrad Seidel, P. Polakowski, Maximilian Lederer, Ricardo Olivo, Thomas Kampfe, David Lehninger, Tarek Ali
Publikováno v:
Appl. Phys. Lett.
The local crystal phase and orientation of ferroelectric grains inside TiN/Hf0.5Zr0.5O2/TiN have been studied by the analysis of the local electron beam scattering Kikuchi patterns, recorded in transmission. Evidence was found that the ferroelectric