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pro vyhledávání: '"Sushruth Goud Perumalla"'
Autor:
Satish Kodali, Thirukumaran Mahalingam, Edmund Banghart, Felix Beaudoin, Wang Tao, Nuh Yuksek, Shweta Arora, Rohan Deshpande, Trejo Rust, Sushruth Goud Perumalla, Lu Yuan, Lillian Li, Rinus T. P. Lee, Wayne Zhao
Publikováno v:
International Symposium for Testing and Failure Analysis.
Fault localization using both dynamic laser stimulation and emission microscopy was used to localize the failing transistors within the failing scan chain latch on multiple samples. Nanoprobing was then performed and the source to drain leakage in N-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7dd178a55cbf1e37a3f63af1c158914
https://doi.org/10.31399/asm.cp.istfa2020p0038
https://doi.org/10.31399/asm.cp.istfa2020p0038
