Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Surya Snata Rout"'
Publikováno v:
Materials, Vol 16, Iss 22, p 7220 (2023)
A focused ion beam scanning electron microscope (FIB-SEM) is a powerful tool that is routinely used for scale imaging from the micro- to nanometer scales, micromachining, prototyping, and metrology. In spite of the significant capabilities of a FIB-S
Externí odkaz:
https://doaj.org/article/1fc1ea6a04664be0ab06d1390cfbcf21
Autor:
Gnanavel Vaidhyanathan Krishnamurthy, Manohar Chirumamilla, Surya Snata Rout, Kaline P. Furlan, Tobias Krekeler, Martin Ritter, Hans-Werner Becker, Alexander Yu Petrov, Manfred Eich, Michael Störmer
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-12 (2021)
Abstract The high-temperature stability of thermal emitters is one of the critical properties of thermophotovoltaic (TPV) systems to obtain high radiative power and conversion efficiencies. W and HfO2 are ideal due to their high melting points and lo
Externí odkaz:
https://doaj.org/article/f68b42314a7c4beb906fa0046e953680